GATE DIELECTRICS
Experts
- Hiroshi Iwai
- Hei Wong
- Eugenio Culurciello
- George J. Papaioannou
- Kuniyuki Kakushima
- Udo Schwalke
- Tillmann Krauss
- Andreas G. Andreou
- Vivek De
- Frank Wessely
- Nicole McFarlane
- Mst Shamim Ara Shawkat
- Hao Li
- Meer Sakib
- Takamasa Kawanago
- Andrea Cester
- H. W. Chen
- Nobuyuki Sugii
- Kazuo Tsutsui
- Haisheng Rong
- Ganesh Balamurugan
- Mohammad Athar Khalil
- Charles F. Hawkins
- Gaudenzio Meneghesso
- Jerry M. Soden
- Matroni Koutsoureli
- Joris Van Campenhout
- James E. Jaussi
- Chin-Long Wey
- James W. Tschanz
- Jong-Tae Park
- Ranjeet Kumar
- P. T. Lai
- Yasushi Nakasaki
- F. V. Farmakis
- Steven Hsu
- Parhat Ahmet
- Yoshinori Ando
- Joseph Ya-min Lee
Venues
- Microelectron. Reliab.
- Sensors
- IEICE Trans. Electron.
- IEEE J. Solid State Circuits
- IRPS
- Microelectron. J.
- IBM J. Res. Dev.
- ISCAS
- IEEE Access
- OFC
- ESSDERC
- ISSCC
- IEICE Electron. Express
- NEMS
- Sci. China Inf. Sci.
- ESSCIRC
- DRC
- ICICDT
- CICC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ITC
- OFC/NFOEC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Proc. IEEE
- VLSI Circuits
- ECOC
- ISCAS (4)
- DAC
- IET Circuits Devices Syst.
- DTIS
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE SENSORS
- Sci. China Ser. F Inf. Sci.
- SmartIoT
- IEEE Trans. Biomed. Circuits Syst.
- Circuits Syst. Signal Process.
- VLSI Technology and Circuits
- ASICON
- ISCAS (6)
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