GATE DIELECTRICS
Experts
- Hiroshi Iwai
- Hei Wong
- Eugenio Culurciello
- George J. Papaioannou
- Udo Schwalke
- Kuniyuki Kakushima
- Frank Wessely
- Andreas G. Andreou
- Nicole McFarlane
- Tillmann Krauss
- Mst Shamim Ara Shawkat
- Hao Li
- Vivek De
- James W. Tschanz
- Ganesh Balamurugan
- H. W. Chen
- Takamasa Kawanago
- Haisheng Rong
- Kazuo Tsutsui
- Charles F. Hawkins
- Meer Sakib
- Jong-Tae Park
- Gaudenzio Meneghesso
- Nobuyuki Sugii
- P. T. Lai
- Jerry M. Soden
- Ranjeet Kumar
- Joris Van Campenhout
- Andrea Cester
- Matroni Koutsoureli
- James E. Jaussi
- Chin-Long Wey
- Mohammad Athar Khalil
- Tie Li
- Parhat Ahmet
- Rosana Rodríguez
- Jörg Henkel
- Chun-Ming Hsu
- Michael A. Suster
Venues
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Sensors
- IEEE J. Solid State Circuits
- IRPS
- Microelectron. J.
- IBM J. Res. Dev.
- ISCAS
- OFC
- IEEE Access
- ESSDERC
- ISSCC
- NEMS
- IEICE Electron. Express
- Sci. China Inf. Sci.
- ESSCIRC
- ICICDT
- CICC
- ITC
- IEEE Trans. Circuits Syst. I Regul. Pap.
- DRC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Circuits Syst. II Express Briefs
- OFC/NFOEC
- DAC
- VLSI Circuits
- ISCAS (4)
- Proc. IEEE
- ECOC
- DTIS
- IEEE SENSORS
- IET Circuits Devices Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- ISCAS (6)
- VLSI Design
- Circuits Syst. Signal Process.
- ISQED
- VLSI Technology and Circuits
- J. Low Power Electron.
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