Mohammad Athar Khalil

Publication Activity (10 Years)

Years Active: 2001-2004
Publications (10 Years): 0

Publications

Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI (2004)
Mohammad Athar Khalil, Chin-Long Wey
Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement. ITC (2001)
Mohammad Athar Khalil, Chin-Long Wey
High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. VTS (2001)