Andrea Cester

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 11

Top Topics

Equivalent Circuit

Gate Dielectrics

Action Potentials

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

Sarah Tonello, Alberto Zacchini, Alessandra Galli, Ata Golparvar, Ali Meimandi, Giacomo Peruzzi, Alessandro Pozzebon, Nicolò Lago, Andrea Cester, Giada Giorgi, Sandro Carrara, Claudio Narduzzi
Design and in vitro Characterization of a Wearable Multisensing System for Hydration Monitoring. IEEE Trans. Instrum. Meas. 73 (2024)
Nicolò Lago, Sara Ruiz Molina, Marta Mas Torrent, Stefano Casalini, Andrea Cester
Signal amplification properties of Electrolyte-Gated Organic Field-Effect Transistors. MetroInd4.0&IoT (2023)
Alessandra Galli, Nicolò Lago, Sarah Tonello, Mario Bortolozzi, Marco Buonomo, Morten Gram Pedersen, Andrea Cester, Giada Giorgi
A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems. IEEE Trans. Instrum. Meas. 71 (2022)
Giada Giorgi, N. Lago, Sarah Tonello, Alessandra Galli, M. Buonuomo, M. G. Pedersen, Andrea Cester
RL-EGOFET cell biosensors: A novel approach for the detection of action potentials. MeMeA (2021)
Sarah Tonello, Giada Giorgi, Simona Pisu, Andrea Cester
Organic substrates for novel printed sensors in neural interfacing: a measurement method for cytocompatibility analysis. MeMeA (2020)
Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester
Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique. Microelectron. Reliab. (2018)
Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester
flexible TFTs. Microelectron. Reliab. (2018)
Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester
Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics. Microelectron. Reliab. 55 (9-10) (2015)
Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects. IRPS (2015)
Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs
Effects of constant voltage and constant current stress in PCBM: P3HT solar cells. Microelectron. Reliab. 55 (9-10) (2015)
Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, G. Cellere
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS (2015)
Marco Barbato, Andrea Cester, Viviana Mulloni, B. Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso
Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures. ESSDERC (2014)
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
Effects of constant voltage stress on organic complementary logic inverters. ESSDERC (2014)
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. Microelectron. Reliab. 54 (9-10) (2014)
Davide Bisi, Antonio Stocco, Matteo Meneghini, Fabiana Rampazzo, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni
Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs. ESSDERC (2014)
Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. Microelectron. Reliab. 53 (9-11) (2013)
Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
Comparison between positive and negative constant current stress on dye-sensitized solar cells. Microelectron. Reliab. 53 (9-11) (2013)
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53 (9-11) (2013)
Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
Reliability study of dye-sensitized solar cells by means of solar simulator and white LED. Microelectron. Reliab. 52 (9-10) (2012)
Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester
Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure. Microelectron. Reliab. 52 (9-10) (2012)
Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester
Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs). Microelectron. Reliab. 51 (9-11) (2011)
Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown
Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED. Microelectron. Reliab. 50 (9-11) (2010)
Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi
Ionising radiation and electrical stress on nanocrystal memory cell array. Microelectron. Reliab. 47 (4-5) (2007)
Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47 (9-11) (2007)
Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46 (9-11) (2006)
S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini
Ionising radiation effects on MOSFET drain current. Microelectron. Reliab. 43 (8) (2003)