Massimo Vanzi

Publication Activity (10 Years)

Years Active: 1986-2021
Publications (10 Years): 4

Top Topics

Diffuse Reflectance

Photometric Stereo

Lighting Direction

Specular Highlights

Top Venues

Microelectron. Reliab.

ICCSA (Workshops)

Digit. Appl. Archaeol. Cult. Heritage

Publications

Anna Concas, Riccardo Dessì, Caterina Fenu, Giuseppe Rodriguez, Massimo Vanzi
Identifying the lights position in photometric stereo under unknown lighting. ICCSA (Workshops) (2021)
Massimo Vanzi, Giovanna Mura, G. Martines
Further improvements of an extended Hakki-Paoli method. Microelectron. Reliab. (2018)
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. (2017)
Massimo Vanzi, Giovanna Mura, Giulia Marcello, K. Xiao
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64 (2016)
Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines
Clamp voltage and ideality factor in laser diodes. Microelectron. Reliab. 55 (9-10) (2015)
Riccardo Dessì, Carla Mannu, Giuseppe Rodriguez, Giuseppa Tanda, Massimo Vanzi
Recent improvements in photometric stereo for rock art 3D imaging. Digit. Appl. Archaeol. Cult. Heritage 2 (2-3) (2015)
Giovanna Mura, Massimo Vanzi, Giulia Marcello
FIB-induced electro-optical alterations in a DFB InP laser diode. Microelectron. Reliab. 54 (9-10) (2014)
Massimo Vanzi, Simona Podda, E. Musu, R. Cao
XEBIC at the Dual Beam. Microelectron. Reliab. 53 (9-11) (2013)
Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi
Optical losses in single-mode laser diodes. Microelectron. Reliab. 53 (9-11) (2013)
Giovanna Mura, Massimo Vanzi, Giulia Marcello, R. Cao
The role of the optical trans-characteristics in laser diode analysis. Microelectron. Reliab. 53 (9-11) (2013)
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53 (9-11) (2013)
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53 (9-11) (2013)
Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52 (5) (2012)
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52 (9-10) (2012)
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51 (9-11) (2011)
Massimo Vanzi, Giovanna Mura, G. Martines
DC parameters for laser diodes from experimental curves. Microelectron. Reliab. 51 (9-11) (2011)
Massimo Vanzi
Editorial. Microelectron. Reliab. 50 (4) (2010)
Giovanna Mura, Massimo Vanzi
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectron. Reliab. 50 (4) (2010)
Giovanna Mura, Massimo Vanzi
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49 (9-11) (2009)
Massimo Vanzi
A model for the DC characteristics of a laser diode. ICECS (2008)
Ruggero Pintus, Simona Podda, Massimo Vanzi
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48 (8-9) (2008)
Matteo Meneghini, L. Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47 (9-11) (2007)
Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, José E. da Franca, Christian Münker
Life begins at 65: unless you are mixed signal? DATE (2007)
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46 (9-11) (2006)
Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni
High brightness GaN LEDs degradation during dc and pulsed stress. Microelectron. Reliab. 46 (9-11) (2006)
Ruggero Pintus, Simona Podda, Massimo Vanzi
Image alignment for 3D reconstruction in a SEM. Microelectron. Reliab. 45 (9-11) (2005)
Francesca Mighela, Cristian Perra, Massimo Vanzi
Video Streaming in Electron Microscopy Applications. VLBV (2005)
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45 (9-11) (2005)
Ruggero Pintus, Simona Podda, Francesca Mighela, Massimo Vanzi
Quantitative 3D reconstruction from BS imaging. Microelectron. Reliab. 44 (9-11) (2004)
Giovanna Mura, Massimo Vanzi, G. Micheletti
Failure analysis of RFIC amplifiers. Microelectron. Reliab. 44 (9-11) (2004)
Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Thick Film Chip Resistors. Microelectron. Reliab. 44 (9-11) (2004)
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43 (9-11) (2003)
Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43 (9-11) (2003)
Fausto Fantini, Massimo Vanzi
Editorial. Microelectron. Reliab. 42 (9-11) (2002)
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42 (9-11) (2002)
Massimo Vanzi, Giulia Salmini, R. Pastorelli, S. Pessina, Paola Furcas
Reliability tests on WDM filters. Microelectron. Reliab. 42 (9-11) (2002)
M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42 (9-11) (2002)
C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi
A specimen-current branching approach for FA of long Electromigration test lines. Microelectron. Reliab. 42 (9-11) (2002)
Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42 (9-11) (2002)
Gaudenzio Meneghesso, Simona Podda, Massimo Vanzi
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. Microelectron. Reliab. 41 (9-10) (2001)
Paola Furcas, Rosaria De Palo, Maria Elena Patella, Giulia Salmini, Massimo Vanzi
Damp Heat test on LiNbO optical modulators. Microelectron. Reliab. 41 (9-10) (2001)
Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi
Editorial. Microelectron. Reliab. 41 (8) (2001)
Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi
A physically based mobility model for numerical simulation of nonplanar devices. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7 (11) (1988)
Zhiping Yu, Robert W. Dutton, Massimo Vanzi
An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6 (1) (1987)
Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5 (4) (1986)