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An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy.
Ruggero Pintus
Simona Podda
Massimo Vanzi
Published in:
IEEE Trans. Instrum. Meas. (2008)
Keyphrases
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photometric stereo
electron microscopy
surface normals
structured light
shape from shading
surface reconstruction
light source
spatially varying
multi view
x ray
shape reconstruction
image segmentation
training set
machine vision
surface inspection