Simona Podda

Publication Activity (10 Years)

Years Active: 2001-2013
Publications (10 Years): 0

Top Topics

Top Venues

Microelectron. Reliab.

Publications

Massimo Vanzi, Simona Podda, E. Musu, R. Cao
XEBIC at the Dual Beam. Microelectron. Reliab. 53 (9-11) (2013)
Ruggero Pintus, Simona Podda, Massimo Vanzi
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. IEEE Trans. Instrum. Meas. 57 (5) (2008)
Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni
High brightness GaN LEDs degradation during dc and pulsed stress. Microelectron. Reliab. 46 (9-11) (2006)
Ruggero Pintus, Simona Podda, Massimo Vanzi
Image alignment for 3D reconstruction in a SEM. Microelectron. Reliab. 45 (9-11) (2005)
Ruggero Pintus, Simona Podda, Francesca Mighela, Massimo Vanzi
Quantitative 3D reconstruction from BS imaging. Microelectron. Reliab. 44 (9-11) (2004)
Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Thick Film Chip Resistors. Microelectron. Reliab. 44 (9-11) (2004)
Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43 (9-11) (2003)
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42 (9-11) (2002)
M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42 (9-11) (2002)
C. Caprile, Ilaria De Munari, Maurizio Impronta, Simona Podda, Andrea Scorzoni, Massimo Vanzi
A specimen-current branching approach for FA of long Electromigration test lines. Microelectron. Reliab. 42 (9-11) (2002)
Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42 (9-11) (2002)
Gaudenzio Meneghesso, Simona Podda, Massimo Vanzi
Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. Microelectron. Reliab. 41 (9-10) (2001)