Backside Failure Analysis of GaAs ICs after ESD tests.

Gaudenzio Meneghesso A. Cocco Giovanna Mura Simona Podda Massimo Vanzi

Published in: Microelectron. Reliab. (2002)

Keyphrases

feature selection
feature extraction
data analysis
image analysis
data sets
image segmentation
wide range
pattern recognition
multiresolution
multiple choice