Giovanna Mura

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 7

Top Topics

Injection Lasers

Gate Dielectrics

Transmission Line

Top Venues

Microelectron. Reliab.

Publications

Giorgio Montisci, Giovanna Mura, Giacomo Muntoni, Giovanni Andrea Casula, Francesco Paolo Chietera, Mahmoud Aburish-Hmidat
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films. IEEE Access 11 (2023)
Giovanna Mura
Reliability concerns from the gray market. Microelectron. Reliab. (2018)
Massimo Vanzi, Giovanna Mura, G. Martines
Further improvements of an extended Hakki-Paoli method. Microelectron. Reliab. (2018)
Riccardo Enrici Vaion, Matteo Medda, Alberto Mancaleoni, Giovanna Mura, A. Pintus, M. De Tomasi
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. Microelectron. Reliab. (2017)
Massimo Vanzi, Giulia Marcello, Giovanna Mura, G. Le Galès, S. Joly, Yannick Deshayes, Laurent Béchou
Practical optical gain by an extended Hakki-Paoli method. Microelectron. Reliab. (2017)
Massimo Vanzi, Giovanna Mura, Giulia Marcello, K. Xiao
ESD tests on 850 nm GaAs-based VCSELs. Microelectron. Reliab. 64 (2016)
Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante
Single Event Transient acquisition and mapping for space device Characterization. Microelectron. Reliab. 64 (2016)
Massimo Vanzi, Giovanna Mura, Giulia Marcello, G. Martines
Clamp voltage and ideality factor in laser diodes. Microelectron. Reliab. 55 (9-10) (2015)
Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, G. Cellere
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. IRPS (2015)
Giovanna Mura, Massimo Vanzi, Giulia Marcello
FIB-induced electro-optical alterations in a DFB InP laser diode. Microelectron. Reliab. 54 (9-10) (2014)
Massimo Vanzi, Giovanna Mura, M. Marongiu, T. Tomasi
Optical losses in single-mode laser diodes. Microelectron. Reliab. 53 (9-11) (2013)
Giovanna Mura, Massimo Vanzi, Giulia Marcello, R. Cao
The role of the optical trans-characteristics in laser diode analysis. Microelectron. Reliab. 53 (9-11) (2013)
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53 (9-11) (2013)
Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. Microelectron. Reliab. 53 (9-11) (2013)
Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52 (5) (2012)
Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52 (9-10) (2012)
Jia Lu, BoCheng Cao, WenShe Wu, YuFeng Dai, ChuangJun Huang, Giovanna Mura
MIM capacitor-related early-stage field failures. Microelectron. Reliab. 52 (9-10) (2012)
Massimo Vanzi, Giovanna Mura, G. Martines
DC parameters for laser diodes from experimental curves. Microelectron. Reliab. 51 (9-11) (2011)
Giovanna Mura, Massimo Vanzi
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectron. Reliab. 50 (4) (2010)
Giovanna Mura, Massimo Vanzi
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectron. Reliab. 49 (9-11) (2009)
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48 (8-9) (2008)
Matteo Meneghini, L. Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47 (9-11) (2007)
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46 (9-11) (2006)
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45 (9-11) (2005)
Giovanna Mura, Massimo Vanzi, G. Micheletti
Failure analysis of RFIC amplifiers. Microelectron. Reliab. 44 (9-11) (2004)
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43 (9-11) (2003)
Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, Gaetano Scamarcio, Giovanna Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich
Reliability of visible GaN LEDs in plastic package. Microelectron. Reliab. 43 (9-11) (2003)
Luca Sponton, Lorenzo Cerati, Giuseppe Croce, Giovanna Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectron. Reliab. 42 (9-11) (2002)
M. Giglio, G. Martines, Giovanna Mura, Simona Podda, Massimo Vanzi
An automated lifetest equipment for optical emitters. Microelectron. Reliab. 42 (9-11) (2002)
Gaudenzio Meneghesso, A. Cocco, Giovanna Mura, Simona Podda, Massimo Vanzi
Backside Failure Analysis of GaAs ICs after ESD tests. Microelectron. Reliab. 42 (9-11) (2002)