Mauro Ciappa

Publication Activity (10 Years)

Years Active: 2001-2021
Publications (10 Years): 9

Top Topics

Electron Microscopy

Top Venues

Microelectron. Reliab.

Publications

Mauro Ciappa, Marco Pocaterra
Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation. IRPS (2021)
Mauro Ciappa, Marco Pocaterra
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources. IRPS (2020)
Mauro Ciappa, Paolo Cova, Gaudenzio Meneghesso, Francesco Iannuzzo
Editorial. Microelectron. Reliab. (2018)
Mauro Ciappa, Ying Pang, Chenchen Sun
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectron. Reliab. (2018)
Ying Pang, Mauro Ciappa
Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays. Microelectron. Reliab. (2018)
Franc Dugal, Mauro Ciappa
Reliability investigation of the copper-zinc system for solid diffusion bonding in power modules. Microelectron. Reliab. (2017)
Takuo Kikuchi, Mauro Ciappa
Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted tunneling. Microelectron. Reliab. 58 (2016)
Hiroshi Suzuki, Mauro Ciappa
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II. Microelectron. Reliab. 58 (2016)
Francesco Iannuzzo, Mauro Ciappa
Reliability issues in power electronics. Microelectron. Reliab. 58 (2016)
Hiroshi Suzuki, Mauro Ciappa
TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition. Microelectron. Reliab. 55 (9-10) (2015)
Mauro Ciappa, Alessandro Blascovich
Reliability odometer for real-time and in situ lifetime measurement of power devices. Microelectron. Reliab. 55 (9-10) (2015)
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov, F. Filosomi, C. Santini
Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy. ESSDERC (2014)
Mauro Ciappa, Alexey Yu. Illarionov, Emre Ilgünsatiroglu
Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields. Microelectron. Reliab. 54 (9-10) (2014)
Franc Dugal, Mauro Ciappa
Study of thermal cycling and temperature aging on PbSnAg die attach solder joints for high power modules. Microelectron. Reliab. 54 (9-10) (2014)
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range. Microelectron. Reliab. 54 (9-10) (2014)
Emre Ilgünsatiroglu, Alexey Yu. Illarionov, Mauro Ciappa
Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications. Microelectron. Reliab. 53 (9-11) (2013)
Franc Dugal, Mauro Ciappa
Avoiding misleading artefacts in metallurgical preparation of die attach solder joints in high power modules. Microelectron. Reliab. 53 (9-11) (2013)
Takuo Kikuchi, Mauro Ciappa
A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs. Microelectron. Reliab. 53 (9-11) (2013)
Mauro Ciappa, Paolo Cova, Francesco Iannuzzo, Gaudenzio Meneghesso
Editorial. Microelectron. Reliab. 52 (9-10) (2012)
Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov
Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies. Microelectron. Reliab. 52 (9-10) (2012)
Satoshi Ono, Mauro Ciappa, Shigeru Hiura, Wolfgang Fichtner
Electro-thermal simulation in the time domain of GaN HEMT for RF switch-mode amplifier. Microelectron. Reliab. 52 (9-10) (2012)
Aniello Esposito, Mauro Ciappa, Wolfgang Fichtner
Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes. Microelectron. Reliab. 51 (9-11) (2011)
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment. J. Electron. Test. 27 (1) (2011)
Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications. Microelectron. Reliab. 51 (9-11) (2011)
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, M. Hommel, Wolfgang Fichtner
A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters. Microelectron. Reliab. 50 (9-11) (2010)
Yuji Sasaki, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner
Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS. Microelectron. Reliab. 50 (9-11) (2010)
Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications. ETS (2010)
Mauro Ciappa, Alexander Koschik, Maurizio Dapor, Wolfgang Fichtner
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy. Microelectron. Reliab. 50 (9-11) (2010)
Haruka Kubo, Mauro Ciappa, Takayuki Masunaga, Wolfgang Fichtner
Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices. Microelectron. Reliab. 49 (9-11) (2009)
Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. ETS (2009)
Mauro Ciappa, Luigi Mangiacapra, Maria Stangoni, Stephan Ott, Wolfgang Fichtner
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation. Microelectron. Reliab. 49 (9-11) (2009)
Vezio Malandruccolo, Mauro Ciappa, Hubert Rothleitner, Wolfgang Fichtner
A new built-in screening methodology to achieve zero defects in the automotive environment. Microelectron. Reliab. 49 (9-11) (2009)
Alberto Castellazzi, Mauro Ciappa
Novel simulation approach for transient analysis and reliable thermal management of power devices. Microelectron. Reliab. 48 (8-9) (2008)
Ulrich Glaser, Kai Esmark, Martin Streibl, Christian Russ, Krzysztof Domanski, Mauro Ciappa, Wolfgang Fichtner
SCR operation mode of diode strings for ESD protection. Microelectron. Reliab. 47 (7) (2007)
Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa
Robustness test and failure analysis of IGBT modules during turn-off. Microelectron. Reliab. 47 (9-11) (2007)
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47 (9-11) (2007)
P. Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach. Microelectron. Reliab. 47 (9-11) (2007)
Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner
Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectron. Reliab. 47 (9-11) (2007)
Davide Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectron. Reliab. 46 (9-11) (2006)
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectron. Reliab. 46 (9-11) (2006)
Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner
Characterization of photonic devices by secondary electron potential contrast. Microelectron. Reliab. 46 (9-11) (2006)
Mauro Ciappa, Wolfgang Fichtner, T. Kojima, Y. Yamada, Y. Nishibe
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles. Microelectron. Reliab. 45 (9-11) (2005)
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices. Microelectron. Reliab. 45 (9-11) (2005)
Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectron. Reliab. 45 (9-11) (2005)
Mauro Ciappa
Lifetime prediction on the base of mission profiles. Microelectron. Reliab. 45 (9-11) (2005)
Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner, Elisa Ricci, Andrea Scorzoni
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques. Microelectron. Reliab. 44 (9-11) (2004)
Chiara Corvasce, Mauro Ciappa, Davide Barlini, S. Sponton, Gaudenzio Meneghesso, Wolfgang Fichtner
Characterization of self-heating effects in semiconductor resistors during transmission line pulses. Microelectron. Reliab. 44 (9-11) (2004)
Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner
N Junction by Scanning Capacitance and Scanning Electron Microscopy. Microelectron. Reliab. 44 (9-11) (2004)
Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy. Microelectron. Reliab. 43 (9-11) (2003)
Giovanna Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectron. Reliab. 43 (9-11) (2003)
Mauro Ciappa, Flavio Carbognani, Paolo Cova, Wolfgang Fichtner
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors. Microelectron. Reliab. 42 (9-11) (2002)
Mauro Ciappa
Selected failure mechanisms of modern power modules. Microelectron. Reliab. 42 (4-5) (2002)
Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectron. Reliab. 42 (9-11) (2002)
H. Yabuhara, Mauro Ciappa, Wolfgang Fichtner
Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications. Microelectron. Reliab. 41 (9-10) (2001)