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Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.
Vezio Malandruccolo
Mauro Ciappa
Wolfgang Fichtner
Hubert Rothleitner
Published in:
ETS (2009)
Keyphrases
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integrated circuit
optimal solution
optimization method
built in self test
neural network
closed form
test cases
integer programming