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Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.

Vezio MalandruccoloMauro CiappaWolfgang FichtnerHubert Rothleitner
Published in: ETS (2009)
Keyphrases
  • integrated circuit
  • optimal solution
  • optimization method
  • built in self test
  • neural network
  • closed form
  • test cases
  • integer programming