BUILT IN SELF TEST
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Kewal K. Saluja
- Hans-Joachim Wunderlich
- Charles E. Stroud
- Patrick Girard
- Janusz Rajski
- Sandeep K. Gupta
- Hafizur Rahaman
- Cheng-Wen Wu
- Michel Renovell
- Laung-Terng Wang
- Jin-Fu Li
- Xiaoqing Wen
- Kuen-Jong Lee
- Jerzy Tyszer
- Kwang-Ting Cheng
- Bhargab B. Bhattacharya
- Vishwani D. Agrawal
- Jacob A. Abraham
- Dimitris Nikolos
- Seiji Kajihara
- Salvador Mir
- Serge Pravossoudovitch
- Yasuo Sato
- Kozo Kinoshita
- Sule Ozev
- Christian Landrault
- Sungho Kang
- Matteo Sonza Reorda
- Cecilia Metra
- Chien-In Henry Chen
- Michael Nicolaidis
- Jacob Savir
- Bozena Kaminska
- Abhijit Chatterjee
- Ilia Polian
- Marcelo Lubaszewski
Venues
- ITC
- VTS
- Asian Test Symposium
- J. Electron. Test.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VLSI Design
- DFT
- IEEE Trans. Very Large Scale Integr. Syst.
- ETS
- DATE
- ISCAS
- ICCD
- IEEE Trans. Computers
- ICCAD
- IOLTS
- IEEE Trans. Instrum. Meas.
- DAC
- DDECS
- ATS
- ISQED
- IEEE Des. Test Comput.
- Microelectron. J.
- CoRR
- J. Circuits Syst. Comput.
- IEEE Des. Test
- EWDTS
- ASP-DAC
- IEEE J. Solid State Circuits
- SBCCI
- DSD
- ICECS
- Systems and Computers in Japan
- LATW
- IOLTW
- IET Comput. Digit. Tech.
- ACM Trans. Design Autom. Electr. Syst.
- ACM Great Lakes Symposium on VLSI
- ETW
- Integr.
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