IOLTW

Keyphrases

Publications

2002

Ari Virtanen
Radiation Effects Facility RADEF. IOLTW (2002)
Carlo Dallavalle
Adaptive IDDQ: How to Set an IDDQ Limit for any Device Under Test. IOLTW (2002)
Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui
Learning-Based On-Line Testing in Feedforward Neural Networks. IOLTW (2002)
Luca Schiano, Cecilia Metra, Diego Marino
Design and Implementation of a Self-Checking Scheme for Railway Trackside Systems. IOLTW (2002)
Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, A. H. Nieuwland, Cecilia Metra
Coding Scheme for Low Energy Consumption Fault-Tolerant Bus. IOLTW (2002)
Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. IOLTW (2002)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW (2002)
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
Analysis of SEU Effects in a Pipelined Processor. IOLTW (2002)
Feng Gao, John P. Hayes
On-Line Monitor Design of Finite-State Machines. IOLTW (2002)
Adam Kristof
On-Line Detection of Short Circuits in Digital Devices and Systems. IOLTW (2002)
Astrit Ademaj, Petr Grillinger, Pavel Herout, Jan Hlavicka
Fault Tolerance Evaluation Using Two Software Based Fault Injection Methods. IOLTW (2002)
Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero
Analysis of the Equivalences and Dominances of Transient Faults at the RT Level. IOLTW (2002)
Manuel G. Gericota, Gustavo R. Alves, Miguel L. Silva, José M. Ferreira
Active Replication: Towards a Truly SRAM-Based FPGA On-Line Concurrent Testing. IOLTW (2002)
Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz
A Low Power Pseudo-Random BIST Technique. IOLTW (2002)
Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini
On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. IOLTW (2002)
Bernard Coloma, Patrick Delaunay, Olivier Husson
High Speed 15 ns 4 Mbits SRAM for Space Application. IOLTW (2002)
Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems. IOLTW (2002)
Bartomeu Alorda, André Ivanov, Jaume Segura
An Off-Chip Sensor Circuit for On-Line Transient Current Testing. IOLTW (2002)
Emmanuel Rondey, Yann Tellier, Simone Borri
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. IOLTW (2002)
Mohammad A. Naal, M. Rakotoar, Emmanuel Simeu, Chouki Aktouf
Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach. IOLTW (2002)
Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto
A System Level Approach in Designing Dual-Duplex Fault Tolerant Embedded Systems. IOLTW (2002)
Petros Oikonomakos, Mark Zwolinski
Transformation Based Insertion of On-Line Testing Resources in a High-Level Synthesis Environment. IOLTW (2002)
Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis
Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. IOLTW (2002)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW (2002)
N. Axelos, J. Watson, D. Taylor, A. Platts
Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing. IOLTW (2002)
Aleksandra Rankov, Gaynor E. Taylor, John Webster
Robust Data Compression for Analogue Test Outputs. IOLTW (2002)
Farzin Karimi, Fabrizio Lombardi
A Scan-Bist Environment for Testing Embedded Memories. IOLTW (2002)
Huy Nguyen, Abhijit Chatterjee
Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. IOLTW (2002)
8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France IOLTW (2002)
F. Kaddour, Sana Rezgui, Raoul Velazco, S. Rodriguez, J. R. De Mingo
Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach. IOLTW (2002)
Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto
Automated Synthesis of SEU Tolerant Architectures from OO Descriptions. IOLTW (2002)
Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky, Sergey Ostanin
Sequential Circuits Applicable for Detecting Different Types of Faults. IOLTW (2002)
Anzhela Yu. Matrosova, Valentina Andreeva, Yu. Sedov
Survivable Discrete Circuits Design. IOLTW (2002)
Miron Abramovici, Charles E. Stroud
BIST-Based Delay-Fault Testing in FPGAs. IOLTW (2002)
Daniele Rossi, Cecilia Metra, Bruno Riccò
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories. IOLTW (2002)
Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. IOLTW (2002)
Fernanda Gusmão de Lima Kastensmidt, Luigi Carro, Raoul Velazco, Ricardo Augusto da Luz Reis
Injecting Multiple Upsets in a SEU Tolerant 8051 Micro-Controller. IOLTW (2002)
Alvin Jee
Defect-Oriented Analysis of Memory BIST Tests. IOLTW (2002)
Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker
Sequential n -Detection Criteria: Keep It Simple. IOLTW (2002)
Valery A. Vardanian, Yervant Zorian
A March-Based Fault Location Algorithm for Static Random Access Memories. IOLTW (2002)
D. Bied-Charreton, D. Guillon, B. Jacques
The YATE Fail-Safe Interface: The User's Point of View. IOLTW (2002)
Ilia Polian, Bernd Becker
Stop & Go BIST. IOLTW (2002)
Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. IOLTW (2002)
Giuseppe Di Gregorio, Maria Grazia La Rosa, Biagio Russo
Checkers for RF Matching Networks on an Automatic Test Board. IOLTW (2002)
Alberto Manzone, Diego De Costantini
Fault Tolerant Insertion and Verification: A Case Study. IOLTW (2002)
Jose Miguel Vieira dos Santos
Recovering Sequential Circuits from Temporary Faults: The Survival Capability of Scan-Cells. IOLTW (2002)
Joan Font, J. Ginard, Eugeni Isern, Miquel Roca, Jaume Segura, Eugenio García
A BICS for CMOS Opamps by Monitoring the Supply Current Peak. IOLTW (2002)
Gian Carlo Cardarilli, F. Kaddour, A. Leandri, Marco Ottavi, Salvatore Pontarelli, Raoul Velazco
Bit Flip Injection in Processor-Based Architectures: A Case Study. IOLTW (2002)
Amine M'sir, Fabrice Monteiro, Abbas Dandache, Bernard Lepley
A High Speed Encoder for Recursive Systematic Convolutive Codes. IOLTW (2002)
Parag K. Lala, B. Kiran Kumar
An Architecture for Self-Healing Digital Systems. IOLTW (2002)