Michael Nicolaidis

ORCID

Publication Activity (10 Years)

Years Active: 1988-2023
Publications (10 Years): 16

Top Venues

IOLTS

ETS

VTS

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Panagiota Papavramidou, Michael Nicolaidis
Reducing Power Dissipation in Memory Repair for High Fault Rates. IEEE Trans. Very Large Scale Integr. Syst. 31 (12) (2023)
Michael G. Dimopoulos, Michael Nicolaidis
The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture. IEEE Trans. Sustain. Comput. 6 (3) (2021)
Panagiota Papavramidou, Michael Nicolaidis
Iterative Diagnosis Approach for ECC-Based Memory Repair. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (2) (2020)
Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard
An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM. IOLTS (2020)
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
A Dynamic Sufficient Condition of Deadlock-Freedom for High-Performance Fault-Tolerant Routing in Networks-on-Chips. IEEE Trans. Emerg. Top. Comput. 8 (3) (2020)
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis
Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 26 (8) (2018)
Thierry Bonnoit, Fraidy Bouesse, Nacer-Eddine Zergainoh, Michael Nicolaidis
Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution. DATE (2018)
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis, Raoul Velazco
Low cost rollback to improve fault-tolerance in VLSI circuits. LASCAS (2017)
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
A Framework for Scalable TSV Assignment and Selection in Three-Dimensional Networks-on-Chips. VLSI Design 2017 (2017)
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
MINI-ESPADA: A low-cost fully adaptive routing mechanism for Networks-on-Chips. LATS (2017)
Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis
Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs. ETS (2017)
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU. ASP-DAC (2017)
Michael Nicolaidis, Michael G. Dimopoulos
Advanced double-sampling architectures. IOLTS (2016)
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
Addressing transient routing errors in fault-tolerant Networks-on-Chips. ETS (2016)
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
A new approach to deadlock-free fully adaptive routing for high-performance fault-tolerant NoCs. DFT (2016)
Panagiota Papavramidou, Michael Nicolaidis
Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS. IEEE Trans. Computers 65 (7) (2016)
Panagiota Papavramidou, Michael Nicolaidis
Low-power memory repair for high defect densities. IOLTS (2015)
Michael Nicolaidis, Panagiota Papavramidou
Memory repair for high defect densities. VTS (2015)
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip. IOLTS (2015)
Dimiter Avresky, Fabien Chaix, Michael Nicolaidis
Congestion-Aware Adaptive Routing in 2D-Mesh Multicores. NCA (2014)
Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. ETS (2014)
Michael G. Dimopoulos, Yi Gang, Lorena Anghel, Mounir Benabdenbi, Nacer-Eddine Zergainoh, Michael Nicolaidis
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip. Microprocess. Microsystems 38 (6) (2014)
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study. J. Electron. Test. 29 (3) (2013)
Michael Nicolaidis, Panagiota Papavramidou
Transparent BIST for ECC-based memory repair. IOLTS (2013)
Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral
Hot topic session 4A: Reliability analysis of complex digital systems. VTS (2013)
Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
Variability-aware and fault-tolerant self-adaptive applications for many-core chips. ETS (2013)
Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. IOLTS (2013)
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis
Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. ISQED (2013)
Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
Variability-aware and fault-tolerant self-adaptive applications for many-core chips. IOLTS (2013)
Panagiota Papavramidou, Michael Nicolaidis
Reducing power dissipation in memory repair for high defect densities. ETS (2013)
Panagiota Papavramidou, Michael Nicolaidis
An iterative diagnosis approach for ECC-based memory repair. VTS (2013)
Enrico Costenaro, Dan Alexandrescu, Kader Belhaddad, Michael Nicolaidis
A Practical Approach to Single Event Transient Analysis for Highly Complex Design. J. Electron. Test. 29 (3) (2013)
Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Guido Groeseneken, Philippe Bonnot
Reliability challenges of real-time systems in forthcoming technology nodes. DATE (2013)
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro
RIIF - Reliability information interchange format. IOLTS (2012)
Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky
Design for test and reliability in ultimate CMOS. DATE (2012)
Michael Nicolaidis
Biologically Inspired Robust Tera-Device Processors. IEEE Des. Test 29 (5) (2012)
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
Through-silicon-via built-in self-repair for aggressive 3D integration. IOLTS (2012)
Panagiota Papavramidou, Michael Nicolaidis
Test algorithms for ECC-based memory repair in nanotechnologies. VTS (2012)
Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems. J. Electron. Test. 28 (1) (2012)
Aymen Fradi, Michael Nicolaidis, Lorena Anghel
Memory BIST with address programmability. IOLTS (2011)
Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh
Variability-aware task mapping strategies for many-cores processor chips. IOLTS (2011)
Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh
Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. ETS (2011)
Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh
Eliminating speed penalty in ECC protected memories. DATE (2011)
Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis
A fault-tolerant deadlock-free adaptive routing for on chip interconnects. DATE (2011)
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
Towards a tool for implementing delay-free ECC in embedded memories. ICCD (2011)
Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs. DFT (2011)
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. ETS (2011)
Gilles Bizot, Dimiter Avresky, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
Self-Recovering Parallel Applications in Multi-core Systems. NCA (2011)
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis
Fourth workshop on dependable and secure nanocomputing. DSN (2010)
Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis
Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems. NCA (2010)
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. IOLTS (2010)
Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac
Enhanced self-configurability and yield in multicore grids. IOLTS (2009)
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis
Third workshop on dependable and secure nanocomputing. DSN (2009)
Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis
Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip. IOLTS (2009)
Hai Yu, Michael Nicolaidis, Lorena Anghel
An effective approach to detect logic soft errors in digital circuits based on GRAAL. ISQED (2009)
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Michael Nicolaidis
Second workshop on dependable and secure nanocomputing. DSN (2008)
Michael Nicolaidis, Renaud Perez, Dan Alexandrescu
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors. VTS (2008)
Eleftherios Kolonis, Michael Nicolaidis
Towards a holistic CAD platform for nanotechnologies. Microelectron. J. 39 (8) (2008)
Michael Nicolaidis
Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force? IOLTS (2008)
Michael Nicolaidis
GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies. IOLTS (2007)
Lorena Anghel, Michael Nicolaidis
Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. IWANN (2007)
Jean Arlat, Ravishankar K. Iyer, Michael Nicolaidis
Workshop on Dependable and Secure Nanocomputing. DSN (2007)
Michael Nicolaidis
GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. ITC (2007)
Lorena Anghel, Cristiano Lazzari, Michael Nicolaidis
Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies. LATW (2006)
Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa
A Transparent based Programmable Memory BIST. ETS (2006)
Michael Nicolaidis
A Low-Cost Single-Event Latchup Mitigation Sscheme. IOLTS (2006)
Michael Nicolaidis
Session Abstract. VTS (2006)
Lorena Anghel, Michael Nicolaidis, Nadine Buard
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? IOLTS (2006)
Lorena Anghel, Michael Nicolaidis
Simulation and Mitigation of Single Event Effects. IOLTS (2005)
Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa
Programmable memory BIST. ITC (2005)
Balkaran S. Gill, Michael Nicolaidis, Christos A. Papachristou
Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM. IOLTS (2005)
Michael Nicolaidis
Design for Mitigation of Single Event Effects. IOLTS (2005)
Balkaran S. Gill, Michael Nicolaidis, Francis G. Wolff, Christos A. Papachristou, Steven L. Garverick
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories. DATE (2005)
Michael Nicolaidis, Lorena Anghel, Nadir Achouri
Memory Defect Tolerance Architectures for Nanotechnologies. J. Electron. Test. 21 (4) (2005)
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. J. Electron. Test. 20 (4) (2004)
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. VTS (2004)
Lorena Anghel, Nadir Achouri, Michael Nicolaidis
Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. PRDC (2004)
Michael Nicolaidis, Nadir Achouri, Slimane Boutobza
Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair. DATE (2003)
Michael Nicolaidis
Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives. ITC (2003)
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. DFT (2003)
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
Memory Built-In Self-Repair for Nanotechnologies. IOLTS (2003)
Michael Nicolaidis
Carry checking/parity prediction adders and ALUs. IEEE Trans. Very Large Scale Integr. Syst. 11 (1) (2003)
Michael Nicolaidis, Nadir Achouri, Slimane Boutobza
Dynamic Data-bit Memory Built-In Self- Repair. ICCAD (2003)
Eric Dupont, Michael Nicolaidis, Peter Rohr
Embedded Robustness IPs for Transient-Error-Free ICs. IEEE Des. Test Comput. 19 (3) (2002)
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. LATW (2002)
Michael Nicolaidis
IP for Embedded Robustness. DATE (2002)
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. DFT (2002)
Michael Nicolaidis
Soft Error Protection for Embedded Memories. MTDT (2002)
Eric Dupont, Michael Nicolaidis
Robustness IPs for Reliability and Security of SoCs. ITC (2002)
Eric Dupont, Michael Nicolaidis, Peter Rohr
Embedded Robustness Ips. DATE (2002)
Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra
Guest Editorial. J. Electron. Test. 18 (3) (2002)
Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, Raoul Velazco
Soft Errors and Tolerance for Soft Errors. VTS (2001)
Eleftherios Kolonis, Michael Nicolaidis
Fail-Safe Synchronization Circuit for Duplicated Systems. DFT (2001)
Michael Nicolaidis, Slimane Boutobza, Nadir Achouri, R. D. Shawn Blanton, Julie Segal, David Y. Lepejian
Designing and Implementing Efficient BISR Techniques for Embedded RAMs. LATW (2001)
Lorena Anghel, Dan Alexandrescu, Michael Nicolaidis
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy. SBCCI (2000)
Lorena Anghel, Michael Nicolaidis
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. DATE (2000)
Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis
On-Line BIST for Testing Analog Circuits. LATW (2000)
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf
Tutorial Statement. DATE (2000)
Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS (2000)
Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton
ISIS: A Fail-Safe Interface Realized in Smart Power Technology. IOLTW (2000)

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Publication Activity (10 Years)

Top Topics

Top Venues

Michael Nicolaidis