Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.

Panagiota Papavramidou Michael Nicolaidis

Published in: IEEE Trans. Computers (2016)

Keyphrases

memory usage
high speed
low cost
power consumption
orders of magnitude
neural network

computational complexity
low voltage
data sets
power supply
image sensor

low power
optimization problems
evolutionary algorithm
computationally efficient
data mining techniques

times faster
memory requirements
computational cost
significant improvement
lower bound