Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.
Panagiota PapavramidouMichael NicolaidisPublished in: IEEE Trans. Computers (2016)
Keyphrases
- memory usage
- high speed
- low cost
- power consumption
- orders of magnitude
- neural network
- computational complexity
- low voltage
- data sets
- power supply
- image sensor
- low power
- optimization problems
- evolutionary algorithm
- computationally efficient
- data mining techniques
- times faster
- memory requirements
- computational cost
- significant improvement
- lower bound