Test algorithms for ECC-based memory repair in nanotechnologies.
Panagiota PapavramidouMichael NicolaidisPublished in: VTS (2012)
Keyphrases
- times faster
- computational cost
- memory usage
- orders of magnitude
- memory requirements
- computational complexity
- theoretical analysis
- database
- machine learning
- learning algorithm
- optimization problems
- computationally efficient
- recently developed
- memory footprint
- limited memory
- memory efficient
- benchmark datasets
- worst case
- data structure
- data sets