Peter Muhmenthaler

Publication Activity (10 Years)

Years Active: 1991-2006
Publications (10 Years): 0

Publications

Ajay Khoche, Peter Muhmenthaler
Session Abstract. VTS (2006)
Peter Muhmenthaler
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. MTDT (2006)
Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai
Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC (2005)
Andreas Leininger, Michael Gössel, Peter Muhmenthaler
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE (2004)
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC (2003)
Peter Muhmenthaler
Outsourcing Test without Standards? ITC (2002)
Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher
Embedded tutorial: TRP: integrating embedded test and ATE. DATE (2001)
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf
Tutorial Statement. DATE (2000)
Peter Muhmenthaler
Cost effective testing of systems on silicon: areas for optimization. ETW (1999)
H.-D. Oberle, Peter Muhmenthaler
Test Pattern Development and Evaluation for DRAMs with Fault Simulator RAMSIM. ITC (1991)
H.-D. Oberle, M. Maue, Peter Muhmenthaler
Enhanced fault modeling for DRAM test and analysis. VTS (1991)