Frank Poehl

Publication Activity (10 Years)

Years Active: 1999-2012
Publications (10 Years): 0

Top Topics

Highly Efficient

Evolutionary Algorithm

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir
Production test challenges for highly integrated mobile phone SOCs - A case study. ETS (2010)
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR (2007)
Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel
On-chip evaluation, compensation and storage of scan diagnosis data. IET Comput. Digit. Tech. 1 (3) (2007)
Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ETS (2006)
Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS (2005)
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE (2005)
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC (2003)
Frank Poehl, Walter Anheier
Quality Determination for Gate Delay Fault Tests Considering Three-State Elements. J. Electron. Test. 14 (1-2) (1999)