Ron Press

Publication Activity (10 Years)

Years Active: 2003-2017
Publications (10 Years): 2

Top Topics

Statistical Significance

Application Specific

Top Venues

Publications

Yoichi Maeda, Jun Matsushima, Ron Press
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. ATS (2017)
Ron Press, Li-C. Wang
ITC and the Future of Test - We've Won. IEEE Des. Test 33 (6) (2016)
Ron Press, Erik H. Volkerink
The ABCs of ITC. IEEE Des. Test Comput. 27 (5) (2010)
Dragon Hsu, Ron Press
Scan Compression Implementation in Industrial Design - Case Study. Asian Test Symposium (2009)
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR (2007)
Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri
Mentor Graphics DFT to Navigate Nanometer Test Challenges. ATS (2006)
Ron Press, Jay Jahangiri
The Demand and Practical Approach for 100x Test Compression. VLSI-SoC (2006)
Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS (2005)
Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press
Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium (2005)
Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE (2005)
Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli
High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. 20 (5) (2003)