High-Frequency, At-Speed Scan Testing.
Xijiang LinRon PressJanusz RajskiPaul ReuterThomas RinderknechtBruce SwansonNagesh TamarapalliPublished in: IEEE Des. Test Comput. (2003)
Keyphrases
- high frequency
- low frequency
- high frequencies
- high resolution
- subband
- discrete wavelet transform
- wavelet transform
- high speed
- wavelet coefficients
- low pass
- visual quality
- multiresolution
- high frequency components
- wavelet decomposition
- frequency band
- multi resolution analysis
- machine learning
- filter bank
- post processing