Thomas Rinderknecht

Publication Activity (10 Years)

Years Active: 2003-2013
Publications (10 Years): 0

Top Topics

Training And Test Sets

Random Selection

Evaluation Methodology

Top Venues

Asian Test Symposium

Publications

Amit Kumar, Janusz Rajski, Sudhakar M. Reddy, Thomas Rinderknecht
On the Generation of Compact Deterministic Test Sets for BIST Ready Designs. Asian Test Symposium (2013)
Santiago Remersaro, Janusz Rajski, Thomas Rinderknecht, Sudhakar M. Reddy, Irith Pomeranz
ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction. DFT (2008)
Liyang Lai, Wu-Tung Cheng, Thomas Rinderknecht
Programmable Scan-Based Logic Built-In Self Test. ATS (2007)
Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill
Signature Based Diagnosis for Logic BIST. ITC (2006)
Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
Hardware Ef.cient LBISTWith Complementary Weights. ICCD (2005)
Liyang Lai, Thomas Rinderknecht, Wu-Tung Cheng, Janak H. Patel
Logic BIST Using Constrained Scan Cells. VTS (2004)
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht
Embedded Test for Low Cost Manufacturing. VLSI Design (2004)
Liyang Lai, Janak H. Patel, Thomas Rinderknecht, Wu-Tung Cheng
Logic BIST with Scan Chain Segmentation. ITC (2004)
Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli
High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. 20 (5) (2003)