TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Stelios Neophytou
- Maria K. Michael
- Seiji Kajihara
- Masashi Sugiyama
- Francis Wlazinski
- Gwénaël Richomme
- Hideo Ito
- Miguel R. D. Rodrigues
- Kundan Nepal
- Xuebo Liu
- Sangeeta Sabharwal
- Aditya Krishna Menon
- Gang Zeng
- Alberto L. Sangiovanni-Vincentelli
- Gang Niu
- Xuebin Qin
- Janusz Rajski
- Jacob L. Jaremko
- Zichen Vincent Zhang
- Jonás Kratochvíl
- Tereza Vojtechová
- Manuj Aggarwal
- Guillermo Sapiro
- Jure Sokolic
- Runzhe Zhan
- Dimitris Nikolos
- Derek F. Wong
- Abhilash Rakkunedeth Hareendranathan
- Dominik Machácek
- Lidia S. Chao
- Pouneh Gorji
- Bhargab B. Bhattacharya
- Sandeep K. Gupta
- Jennifer Dworak
- Robert Weismantel
- Nan Lu
- Dieter Hofbauer
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- VTS
- Asian Test Symposium
- J. Chem. Inf. Model.
- ETS
- ITC
- DAC
- J. Electron. Test.
- SSPR/SPR
- HASE
- ICASSP
- ICST
- AISTATS
- J. Comput. Syst. Sci.
- IEICE Trans. Inf. Syst.
- DATE
- VLSI Design
- IEEE Access
- NIPS
- J. Circuits Syst. Comput.
- IET Comput. Digit. Tech.
- LREC
- Software Engineering
- ACL (Findings)
- ICACT
- RTA
- Inf. Comput.
- Theor. Comput. Sci.
- PODC
- PRDC
- Microprocess. Microsystems
- Bioinform.
- CVPR
- J. Comput. Appl. Math.
- HLT-NAACL
- GECCO
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