TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Maria K. Michael
- Stelios Neophytou
- Hideo Ito
- Francis Wlazinski
- Masashi Sugiyama
- Seiji Kajihara
- Gwénaël Richomme
- Miguel R. D. Rodrigues
- Janusz Rajski
- Dieter Hofbauer
- Kundan Nepal
- Gang Zeng
- Derek F. Wong
- Jacob L. Jaremko
- Jonás Kratochvíl
- Sandeep K. Gupta
- Paul Ammann
- Guillermo Sapiro
- Taghi M. Khoshgoftaar
- Jennifer Dworak
- Maria Huber
- Lidia S. Chao
- Jure Sokolic
- Sangeeta Sabharwal
- Dominik Machácek
- Abhilash Rakkunedeth Hareendranathan
- Robert Weismantel
- Tereza Vojtechová
- Xuebin Qin
- Bhargab B. Bhattacharya
- Ioannis Voyiatzis
- Kozo Kinoshita
- Dimitris Nikolos
- Nan Lu
- Jeevesh Kapur
- Alberto L. Sangiovanni-Vincentelli
- Raja Giryes
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- J. Chem. Inf. Model.
- VTS
- Asian Test Symposium
- DAC
- ITC
- ETS
- IEICE Trans. Inf. Syst.
- ICASSP
- J. Comput. Syst. Sci.
- DATE
- ICST
- J. Electron. Test.
- AISTATS
- HASE
- NIPS
- IEEE Access
- SSPR/SPR
- VLSI Design
- J. Circuits Syst. Comput.
- Nat. Mac. Intell.
- HLT-NAACL
- BlackboxNLP@EMNLP
- PODC
- Kybernetika
- SLSP
- ISSRE
- IET Comput. Digit. Tech.
- Neurocomputing
- SAC
- ACL/IJCNLP (1)
- Developments in Language Theory
- J. Mach. Learn. Res.
- Oper. Res. Forum
- Symposium on Testing, Analysis, and Verification
- IEEE Trans. Instrum. Meas.
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