TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Seiji Kajihara
- Hideo Ito
- Masashi Sugiyama
- Maria K. Michael
- Stelios Neophytou
- Gwénaël Richomme
- Francis Wlazinski
- Lidia S. Chao
- Runzhe Zhan
- Russell Greiner
- Jennifer Dworak
- Nan Lu
- Taghi M. Khoshgoftaar
- Jacob L. Jaremko
- Kozo Kinoshita
- Ondrej Bojar
- Gang Zeng
- Derek F. Wong
- Ioannis Voyiatzis
- Jeevesh Kapur
- Janusz Rajski
- Manuj Aggarwal
- Miguel R. D. Rodrigues
- Jonás Kratochvíl
- Xuebin Qin
- Kundan Nepal
- Alberto L. Sangiovanni-Vincentelli
- Tereza Vojtechová
- Maria Huber
- Guillermo Sapiro
- Sangeeta Sabharwal
- Robert Weismantel
- Jure Sokolic
- Raja Giryes
- Abhilash Rakkunedeth Hareendranathan
- Gang Niu
- Roberto Vega
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- J. Chem. Inf. Model.
- VTS
- Asian Test Symposium
- DAC
- ETS
- ITC
- J. Circuits Syst. Comput.
- VLSI Design
- ICASSP
- IEEE Access
- NIPS
- J. Comput. Syst. Sci.
- DATE
- HASE
- IEICE Trans. Inf. Syst.
- ICST
- AISTATS
- Nat. Mac. Intell.
- SSPR/SPR
- J. Electron. Test.
- ISQED
- Inf. Comput.
- ACL (Findings)
- ATS
- ICLR
- Complex Syst.
- IOLTS
- IEEE Trans. Pattern Anal. Mach. Intell.
- GECCO
- ICNN
- ICMLA
- Bioinform.
- IPMI
- ICTAI
- Mach. Learn.
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