TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Masashi Sugiyama
- Seiji Kajihara
- Maria K. Michael
- Gwénaël Richomme
- Hideo Ito
- Francis Wlazinski
- Stelios Neophytou
- Jure Sokolic
- Ondrej Bojar
- Guillermo Sapiro
- Raja Giryes
- Gang Zeng
- Jennifer Dworak
- Dominik Machácek
- Sangeeta Sabharwal
- Kundan Nepal
- Janusz Rajski
- Kozo Kinoshita
- Taghi M. Khoshgoftaar
- Sandeep K. Gupta
- Maria Huber
- Tereza Vojtechová
- Nan Lu
- Xuebo Liu
- Jacob L. Jaremko
- Derek F. Wong
- Xuebin Qin
- Zichen Vincent Zhang
- Paul Ammann
- Gang Niu
- Manuj Aggarwal
- Aditya Krishna Menon
- Runzhe Zhan
- Jonás Kratochvíl
- Lidia S. Chao
- Ioannis Voyiatzis
- Jeevesh Kapur
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- Asian Test Symposium
- VTS
- J. Chem. Inf. Model.
- ITC
- ETS
- DAC
- ICASSP
- Nat. Mac. Intell.
- J. Electron. Test.
- J. Circuits Syst. Comput.
- DATE
- IEICE Trans. Inf. Syst.
- VLSI Design
- ICST
- IEEE Access
- AISTATS
- NIPS
- J. Comput. Syst. Sci.
- HASE
- SSPR/SPR
- SCCC
- Discret. Appl. Math.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Neurocomputing
- J. Inf. Process. Syst.
- LREC
- SAST
- ICTSS
- ICANN
- BlackboxNLP@EMNLP
- Intell. Data Anal.
- Oper. Res. Forum
- IEEE Trans. Knowl. Data Eng.
- Tiny Papers @ ICLR
- ACM Great Lakes Symposium on VLSI
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