TRAINING AND TEST SETS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gwénaël Richomme
- Seiji Kajihara
- Masashi Sugiyama
- Francis Wlazinski
- Hideo Ito
- Stelios Neophytou
- Maria K. Michael
- Miguel R. D. Rodrigues
- Manuj Aggarwal
- Runzhe Zhan
- Aditya Krishna Menon
- Ondrej Bojar
- Xuebo Liu
- Roberto Vega
- Pouneh Gorji
- Alberto L. Sangiovanni-Vincentelli
- Gang Niu
- Russell Greiner
- Raja Giryes
- Zichen Vincent Zhang
- Jeevesh Kapur
- Nan Lu
- Dimitris Nikolos
- Kozo Kinoshita
- Ioannis Voyiatzis
- Bhargab B. Bhattacharya
- Robert Weismantel
- Xuebin Qin
- Abhilash Rakkunedeth Hareendranathan
- Tereza Vojtechová
- Dominik Machácek
- Sangeeta Sabharwal
- Jure Sokolic
- Maria Huber
- Lidia S. Chao
- Jennifer Dworak
- Taghi M. Khoshgoftaar
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- IEEE Trans. Very Large Scale Integr. Syst.
- Asian Test Symposium
- VTS
- J. Chem. Inf. Model.
- ETS
- ITC
- DAC
- J. Electron. Test.
- AISTATS
- HASE
- ICST
- Nat. Mac. Intell.
- J. Circuits Syst. Comput.
- VLSI Design
- SSPR/SPR
- NIPS
- IEEE Access
- IEICE Trans. Inf. Syst.
- ICASSP
- DATE
- J. Comput. Syst. Sci.
- DELTA
- GECCO
- PRDC
- Neural Comput. Appl.
- ICACT
- EUROSPEECH
- VLSI-SOC
- MFCS
- ACM Trans. Design Autom. Electr. Syst.
- ICLR (Poster)
- Proc. IEEE
- LATW
- ICANN
- ESA
- DFT
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