Jennifer Dworak

Publication Activity (10 Years)

Years Active: 1999-2024
Publications (10 Years): 24

Top Topics

Fault Detection

Test Generation

Semiconductor Devices

Top Venues

J. Electron. Test.

Publications

Alexander Coyle, Hui Jiang, Jennifer Dworak, Theodore W. Manikas, Kundan Nepal
Dual Use Circuitry for Early Failure Warning and Test. ISQED (2024)
Eslam Yassien, Yongjia Xu, Hui Jiang, Thach Nguyen, Jennifer Dworak, Theodore Manikas, Kundan Nepal
Harvesting Wasted Clock Cycles for Efficient Online Testing. ETS (2023)
Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift. J. Electron. Test. 39 (2) (2023)
Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, R. Iris Bahar
Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits. ITC (2021)
Soha Alhelaly, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Ping Gui, Alfred L. Crouch
3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak
A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift. IEEE Des. Test 37 (4) (2020)
David Brauchler, Jennifer Dworak
Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks. ITC (2020)
Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS (2019)
Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Matan Segal, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
Test Architecture for Fine Grained Capture Power Reduction. ICECS (2019)
Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electron. Test. 35 (6) (2019)
Saurabh Gupta, Bonita Bhaskaran, Shantanu Sarangi, Ayub Abdollahian, Jennifer Dworak
A Novel Graph Coloring Based Solution for Low-Power Scan Shift. VTS (2019)
Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak
One more time! Increasing fault detection with scan shift capture. NATW (2018)
Senwen Kan, Jennifer Dworak
IJTAG Integrity Checking with Chained Hashing. ITC (2018)
Senwen Kan, Jennifer Dworak
Can Soft Errors be Handled Securely? ISVLSI (2018)
Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah
Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. VTS (2018)
Saurabh Gupta, Jae Wu, Jennifer Dworak
Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. VTS (2018)
Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch
Detecting a trojan die in 3D stacked integrated circuits. NATW (2017)
Senwen Kan, Jennifer Dworak
Systematic Test Generation for Secure Hardware Supported Virtualization. DASC/PiCom/DataCom/CyberSciTech (2017)
Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels
Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. ITC (2017)
Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch
Mitigating simple power analysis attacks on LSIB key logic. NATW (2017)
Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. NATW (2016)
Senwen Kan, Matthew Lam, Tyler Porter, Jennifer Dworak
A Case Study: Pre-Silicon SoC RAS Validation for NoC Server Processor. MTV (2016)
Senwen Kan, Jennifer Dworak, James George Dunham
Echeloned IJTAG data protection. AsianHOST (2016)
Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC (2016)
Jennifer Dworak, Al Crouch
A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. VTS (2015)
Kundan Nepal, Soha Alhelaly, Jennifer Dworak, R. Iris Bahar, Theodore W. Manikas, Ping Guikundan
Repairing a 3-D Die-Stack Using Available Programmable Logic. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34 (5) (2015)
Senwen Kan, Marco Ottavi, Jennifer Dworak
Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation. DFTS (2015)
Jennifer Dworak, Ping Gui, Qutaiba Khasawneh
An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices. NATW (2015)
Tassanee Payakapan, Senwen Kan, Ken Pham, Kathy Yang, Jean-Francois Cote, Martin Keim, Jennifer Dworak
A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor. ITC (2015)
Fanchen Zhang, Micah Thornton, Jennifer Dworak
When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG. NATW (2014)
Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter
Board security enhancement using new locking SIB-based architectures. ITC (2014)
Senwen Kan, Jennifer Dworak
Triggering Trojans in SRAM circuits with X-propagation. DFT (2014)
Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter
Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. DATE (2014)
Jennifer Dworak
Special session 4A: Elevator talks. VTS (2014)
Yiwen Shi, Jennifer Dworak
A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects. J. Electron. Test. 29 (3) (2013)
Mitchell A. Thornton, Jennifer Dworak
Ternary Logic Network Justification Using Transfer Matrices. ISMVL (2013)
Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton
Don't forget to lock your SIB: Hiding instruments using P16871. ITC (2013)
Kundan Nepal, Xi Shen, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar
Built-in Self-Repair in a 3D die stack using programmable logic. DFTS (2013)
Jennifer Dworak, Ronald Shawn Blanton, Masahiro Fujita, Kazumi Hatayama, Naghmeh Karimi, Michail Maniatakos, Antonis M. Paschalis, Adit D. Singh, Tian Xia
Special session 4B: Elevator talks. VTS (2013)
Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test 30 (5) (2013)
Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (5) (2012)
Jennifer Dworak, Kundan Nepal, Nuno Alves, Yiwen Shi, Nicholas Imbriglia, R. Iris Bahar
Using implications to choose tests through suspect fault identification. ACM Trans. Design Autom. Electr. Syst. 18 (1) (2012)
Yiwen Shi, Kantapon Kaewtip, Wan-Chan Hu, Jennifer Dworak
Partial state monitoring for fault detection estimation. ITC (2011)
Nuno Alves, Yiwen Shi, Nicholas Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. ETS (2011)
Nuno Alves, Yiwen Shi, Jennifer Dworak, R. Iris Bahar, Kundan Nepal
Enhancing online error detection through area-efficient multi-site implications. VTS (2011)
Yiwen Shi, Wan-Chan Hu, Jennifer Dworak
Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS (2010)
Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel
NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE (2010)
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
Improving the testability and reliability of sequential circuits with invariant logic. ACM Great Lakes Symposium on VLSI (2010)
Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak
On Reducing Scan Shift Activity at RTL. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (7) (2010)
Nuno Alves, Alison Buben, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
A Cost Effective Approach for Online Error Detection Using Invariant Relationships. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29 (5) (2010)
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan Nepal
Compacting test vector sets via strategic use of implications. ICCAD (2009)
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar
Detecting errors using multi-cycle invariance information. DATE (2009)
Yiwen Shi, Kellie DiPalma, Jennifer Dworak
Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization. DFT (2008)
Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak
Reducing Scan Shift Power at RTL. VTS (2008)
Kundan Nepal, Nuno Alves, Jennifer Dworak, R. Iris Bahar
Using Implications for Online Error Detection. ITC (2008)
Jennifer Dworak
An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting. VTS (2007)
Jennifer Dworak
Which defects are most critical? optimizing test sets to minimize failures due to test escapes. ITC (2007)
Vladimir Stojanovic, R. Iris Bahar, Jennifer Dworak, Richard Weiss
A cost-effective implementation of an ECC-protected instruction queue for out-of-order microprocessors. DAC (2006)
Jennifer Dworak
An Investigation of Excitation Balance and Additional Mandatory Conditions for the Diagnosis of Fortuitously Detected Defects. MTV (2005)
Jennifer Dworak, James Wingfield, M. Ray Mercer
A Preliminary Investigation of Observation Diversity for Enhancing Fortuitous Detection of Defects. DFT (2004)
Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects. DATE (2004)
Jennifer Dworak, David Dorsey, Amy Wang, M. Ray Mercer
Excitation, Observation, and ELF-MD: Optimization Criteria for High Quality Test Sets. VTS (2004)
James Wingfield, Jennifer Dworak, M. Ray Mercer
Function-Based Dynamic Compaction and its Impact on Test Set Sizes. DFT (2003)
Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC (2002)
Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams
Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC (2002)
Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT (2002)
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. DATE (2002)
Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. 18 (1) (2001)
Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC (2000)
Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium (2000)
Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS (1999)
Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC (1999)