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A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.
Sooryong Lee
Brad Cobb
Jennifer Dworak
Michael R. Grimaila
M. Ray Mercer
Published in:
DATE (2002)
Keyphrases
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test set
learning algorithm
objective function
training set
computational complexity
error rate
optimal solution
detection algorithm
memory requirements
database
k means
test data
randomly selected