Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects.
Yiwen ShiWan-Chan HuJennifer DworakPublished in: VTS (2010)
Keyphrases
- test set
- test cases
- fault diagnosis
- fault detection
- error rate
- error detection
- training set
- false positives
- detection accuracy
- test data
- multiple faults
- detection method
- detection algorithm
- automatic detection
- model based diagnosis
- fault detection and isolation
- detection rate
- fault model
- fault detection and diagnosis
- built in self test
- evaluation methodology
- relation extraction
- false alarms
- neural network
- upper bound
- classification accuracy
- training data