EVALUATION METHODOLOGY
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Tetsuya Sakai
- Ian Soboroff
- Nicola Ferro
- Noriko Kando
- Ben Carterette
- Ellen M. Voorhees
- Matthew Lease
- Mark Sanderson
- Mücahid Kutlu
- Muhammad Ali Babar
- Douglas W. Oard
- Hafizur Rahaman
- Xrysovalantis Kavousianos
- Krishnendu Chakrabarty
- Bhargab B. Bhattacharya
- Jimmy Lin
- Felisa Verdejo
- Falk Scholer
- W. Eric Wong
- Maria K. Michael
- Guido Zuccon
- Stelios Neophytou
- Dimitris Nikolos
- Spyros Tragoudas
- William R. Hersh
- Janak H. Patel
- Jaap Kamps
- Steffen Eger
- Dimitrios Kagaris
- Alistair Moffat
- Freddy Paz
- Dipak Kumar Kole
- Tamer Elsayed
- Marco Ferrante
- Allan Hanbury
- Aditya P. Mathur
- Jaroslaw Watróbski
Venues
- CoRR
- SIGIR
- IEEE Access
- LREC
- NTCIR
- ITC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Computers
- Sensors
- CIKM
- VTS
- IEEE Trans. Very Large Scale Integr. Syst.
- ACL (1)
- INTERSPEECH
- Expert Syst. Appl.
- J. Electron. Test.
- J. Syst. Softw.
- Asian Test Symposium
- VLSI Design
- AMIA
- EMNLP
- IEEE Trans. Instrum. Meas.
- Reliab. Eng. Syst. Saf.
- VALUETOOLS
- CLEF
- Inf. Process. Manag.
- EVIA@NTCIR
- COLING
- DATE
- HICSS
- Inf. Retr.
- Scientometrics
- J. Assoc. Inf. Sci. Technol.
- EMBC
- Behav. Inf. Technol.
- IGARSS
- AAAI
- J. Biomed. Informatics
- ECIR
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