EVALUATION METHODOLOGY
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Tetsuya Sakai
- Ian Soboroff
- Nicola Ferro
- Noriko Kando
- Ben Carterette
- Ellen M. Voorhees
- Matthew Lease
- Mücahid Kutlu
- Muhammad Ali Babar
- Mark Sanderson
- Douglas W. Oard
- Hafizur Rahaman
- Xrysovalantis Kavousianos
- Krishnendu Chakrabarty
- Bhargab B. Bhattacharya
- Falk Scholer
- Jimmy Lin
- Spyros Tragoudas
- Guido Zuccon
- Felisa Verdejo
- Stelios Neophytou
- Dimitris Nikolos
- Maria K. Michael
- W. Eric Wong
- Freddy Paz
- Marco Ferrante
- Dimitrios Kagaris
- Tamer Elsayed
- Alistair Moffat
- William R. Hersh
- Janak H. Patel
- Allan Hanbury
- Steffen Eger
- Dipak Kumar Kole
- Jaap Kamps
- Edward J. McCluskey
- Arturo Moquillaza
Venues
- CoRR
- SIGIR
- IEEE Access
- LREC
- NTCIR
- ITC
- IEEE Trans. Computers
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Sensors
- CIKM
- VTS
- ACL (1)
- IEEE Trans. Very Large Scale Integr. Syst.
- Expert Syst. Appl.
- INTERSPEECH
- VLSI Design
- Asian Test Symposium
- J. Electron. Test.
- J. Syst. Softw.
- Reliab. Eng. Syst. Saf.
- AMIA
- IEEE Trans. Instrum. Meas.
- VALUETOOLS
- EMNLP
- CLEF
- EVIA@NTCIR
- Inf. Process. Manag.
- COLING
- HICSS
- Scientometrics
- DATE
- Inf. Retr.
- IGARSS
- J. Assoc. Inf. Sci. Technol.
- J. Biomed. Informatics
- AAAI
- ECIR
- Behav. Inf. Technol.
- EMBC
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