FAULT MODEL
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Matteo Sonza Reorda
- Debdeep Mukhopadhyay
- Kewal K. Saluja
- Jean-Max Dutertre
- Vishwani D. Agrawal
- Jakub Breier
- Sun-Yuan Hsieh
- Ilia Polian
- Jin-Fu Li
- Shivam Bhasin
- Régis Leveugle
- Cecilia Metra
- Subhamoy Maitra
- Janak H. Patel
- Kuen-Jong Lee
- Domenico Cotroneo
- John P. Hayes
- Ravishankar K. Iyer
- Wu-Tung Cheng
- Said Hamdioui
- Assia Tria
- Stefan Mangard
- Michele Favalli
- Roberto Natella
- Cheng-Wen Wu
- Patrick Girard
- Hiroshi Takahashi
- Sreejit Chakravarty
- Alberto Bosio
- Kwang-Ting Cheng
- Premachandran R. Menon
- Raimund Ubar
- Subhadeep Banik
- Yoshinobu Higami
- Eliane Martins
- Ad J. van de Goor
- Vincent Beroulle
Venues
- CoRR
- IACR Cryptol. ePrint Arch.
- ITC
- IEEE Trans. Computers
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- FDTC
- DATE
- J. Electron. Test.
- Asian Test Symposium
- IEEE Access
- DFT
- DAC
- IOLTS
- VLSI Design
- ICCAD
- IEEE Trans. Ind. Electron.
- SAFECOMP
- ETS
- DSD
- IEEE Trans. Very Large Scale Integr. Syst.
- DDECS
- DSN
- Sensors
- ISCAS
- EDCC
- IACR Trans. Cryptogr. Hardw. Embed. Syst.
- Reliab. Eng. Syst. Saf.
- CARDIS
- J. Cryptogr. Eng.
- HOST
- ICCD
- ATS
- IET Comput. Digit. Tech.
- RFC
- LATW
- FTCS
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ACC
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