FAULT MODEL
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Matteo Sonza Reorda
- Debdeep Mukhopadhyay
- Kewal K. Saluja
- Vishwani D. Agrawal
- Jean-Max Dutertre
- Jakub Breier
- Sun-Yuan Hsieh
- Ilia Polian
- Jin-Fu Li
- Régis Leveugle
- Shivam Bhasin
- Subhamoy Maitra
- Cecilia Metra
- Domenico Cotroneo
- Ravishankar K. Iyer
- John P. Hayes
- Kuen-Jong Lee
- Janak H. Patel
- Said Hamdioui
- Assia Tria
- Roberto Natella
- Michele Favalli
- Stefan Mangard
- Wu-Tung Cheng
- Cheng-Wen Wu
- Patrick Girard
- Sreejit Chakravarty
- Hiroshi Takahashi
- Alberto Bosio
- Premachandran R. Menon
- Raimund Ubar
- Yoshinobu Higami
- Kwang-Ting Cheng
- Subhadeep Banik
- Naofumi Homma
- Krishnendu Chakrabarty
- Andreas Steininger
Venues
- CoRR
- IACR Cryptol. ePrint Arch.
- ITC
- IEEE Trans. Computers
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- FDTC
- DATE
- J. Electron. Test.
- Asian Test Symposium
- DFT
- IEEE Access
- DAC
- IOLTS
- VLSI Design
- ICCAD
- SAFECOMP
- IEEE Trans. Ind. Electron.
- DSD
- ETS
- DDECS
- IEEE Trans. Very Large Scale Integr. Syst.
- DSN
- Sensors
- ISCAS
- EDCC
- IACR Trans. Cryptogr. Hardw. Embed. Syst.
- Reliab. Eng. Syst. Saf.
- HOST
- J. Cryptogr. Eng.
- CARDIS
- ICCD
- ATS
- LATW
- IET Comput. Digit. Tech.
- RFC
- ACC
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- FTCS
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