Jean-Max Dutertre

ORCID

Publication Activity (10 Years)

Years Active: 2001-2024
Publications (10 Years): 64

Top Venues

Publications

Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
DELFINES: Detecting Laser Fault Injection Attacks via Digital Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (3) (2024)
Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima, Matthieu Pommies, Anthony Bertrand
Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations. J. Cryptogr. Eng. 14 (2) (2024)
Paul Grandamme, Pierre-Antoine Tissot, Lilian Bossuet, Jean-Max Dutertre, Brice Colombier, Vincent Grosso
Switching Off your Device Does Not Protect Against Fault Attacks. IACR Cryptol. ePrint Arch. 2024 (2024)
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design. IOLTS (2024)
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models. FDTC (2023)
Nathan Roussel, Olivier Potin, Jean-Max Dutertre, Jean-Baptiste Rigaud
Security Evaluation of a Hybrid CMOS/MRAM Ascon Hardware Implementation. DATE (2023)
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
A CCFI Verification Scheme Based on the RISC-V Trace Encoder. COSADE (2023)
Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié
Evaluation of Parameter-Based Attacks Against Embedded Neural Networks with Laser Injection. SAFECOMP (2023)
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
Experimental EMFI detection on a RISC-V core using the Trace Verifier solution. Microprocess. Microsystems 103 (2023)
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
CIFER: Code Integrity and control Flow verification for programs Executed on a RISC-V core. HOST (2023)
Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models. CoRR (2023)
Roukoz Nabhan, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger, Laurent Sauvage
Highlighting Two EM Fault Models While Analyzing a Digital Sensor Limitations. DATE (2023)
Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Mathieu Dumont
Fault Injection and Safe-Error Attack for Extraction of Embedded Neural Network Models. ESORICS Workshops (2) (2023)
François Bonnal, Vincent Dupaquis, Olivier Potin, Jean-Max Dutertre
Software-Only Control-Flow Integrity Against Fault Injection Attacks. DSD (2023)
Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip. CoRR (2023)
Clément Gaine, Jean-Pierre Nikolovski, Driss Aboulkassimi, Jean-Max Dutertre
Active Shielding Against Physical Attacks by Observation and Fault Injection: ChaXa. J. Hardw. Syst. Secur. 7 (1) (2023)
Théophile Gousselot, Olivier Thomas, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud
Lightweight Countermeasures Against Original Linear Code Extraction Attacks on a RISC-V Core. HOST (2023)
Clément Gaine, Pierre-Alain Moëllic, Olivier Potin, Jean-Max Dutertre
Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip. DSD (2023)
Mathieu Dumont, Kevin Hector, Pierre-Alain Moëllic, Jean-Max Dutertre, Simon Pontié
Evaluation of Parameter-based Attacks against Embedded Neural Networks with Laser Injection. CoRR (2023)
Nathan Roussel, Oliver Potin, Gregory di Pendina, Jean-Max Dutertre, Jean-Baptiste Rigaud
CMOS/STT-MRAM Based Ascon LWC: a Power Efficient Hardware Implementation. ICECS 2022 (2022)
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria
Photonic power firewalls. J. Cryptogr. Eng. 12 (3) (2022)
Kevin Hector, Pierre-Alain Moëllic, Mathieu Dumont, Jean-Max Dutertre
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks. IOLTS (2022)
Anthony Zgheib, Olivier Potin, Jean-Baptiste Rigaud, Jean-Max Dutertre
A CFI Verification System based on the RISC-V Instruction Trace Encoder. DSD (2022)
Kevin Hector, Mathieu Dumont, Pierre-Alain Moëllic, Jean-Max Dutertre
A Closer Look at Evaluating the Bit-Flip Attack Against Deep Neural Networks. CoRR (2022)
William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre
An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation. IOLTS (2022)
Raphael Viera, Jean-Max Dutertre, Rodrigo Silva Lima
Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations. ASHES@CCS (2022)
Mohammad Ebrahimabadi, Suhee Sanjana Mehjabin, Raphael Viera, Sylvain Guilley, Jean-Luc Danger, Jean-Max Dutertre, Naghmeh Karimi
Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors. HOST (2022)
Vanthanh Khuat, Jean-Luc Danger, Jean-Max Dutertre
Laser Fault Injection in a 32-bit Microcontroller: from the Flash Interface to the Execution Pipeline. FDTC (2021)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
FaultLine: Software-Based Fault Injection on Memory Transfers. HOST (2021)
Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard
An Overview of Laser Injection against Embedded Neural Network Models. WF-IoT (2021)
Mathieu Dumont, Pierre-Alain Moëllic, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rémi Bernhard
An Overview of Laser Injection against Embedded Neural Network Models. CoRR (2021)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
SideLine: How Delay-Lines (May) Leak Secrets from Your SoC. COSADE (2021)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Mathieu Dumont, Pierre-Alain Moëllic
Permanent Laser Fault Injection into the Flash Memory of a Microcontroller. NEWCAS (2021)
William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
Further Analysis of Laser-induced IR-drop. ATS (2021)
Vanthanh Khuat, Jean-Max Dutertre, Jean-Luc Danger
Analysis of a Laser-induced Instructions Replay Fault Model in a 32-bit Microcontroller. DSD (2021)
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
Luring Transferable Adversarial Perturbations for Deep Neural Networks. IJCNN (2021)
Alexandre Menu, Jean-Max Dutertre, Olivier Potin, Jean-Baptiste Rigaud, Jean-Luc Danger
Experimental Analysis of the Electromagnetic Instruction Skip Fault Model. DTIS (2020)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
SideLine: How Delay-Lines (May) Leak Secrets from your SoC. CoRR (2020)
Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moëllic, Jean-Luc Danger
Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. FDTC (2020)
William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert
Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. SBCCI (2020)
Clément Gaine, Driss Aboulkassimi, Simon Pontié, Jean-Pierre Nikolovski, Jean-Max Dutertre
Electromagnetic Fault Injection as a New Forensic Approach for SoCs. WIFS (2020)
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (6) (2020)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
SideLine: How Delay-Lines (May) Leak Secrets from your SoC. IACR Cryptol. ePrint Arch. 2020 (2020)
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
Luring of Adversarial Perturbations. CoRR (2020)
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
Impact of Low-bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks. CoRR (2019)
Alexandre Menu, Shivam Bhasin, Jean-Max Dutertre, Jean-Baptiste Rigaud, Jean-Luc Danger
Precise Spatio-Temporal Electromagnetic Fault Injections on Data Transfers. FDTC (2019)
Jean-Max Dutertre, Timothée Riom, Olivier Potin, Jean-Baptiste Rigaud
Experimental Analysis of the Laser-Induced Instruction Skip Fault Model. NordSec (2019)
Rémi Bernhard, Pierre-Alain Moëllic, Jean-Max Dutertre
Impact of Low-Bitwidth Quantization on the Adversarial Robustness for Embedded Neural Networks. CW (2019)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi, Francis Olivier
Remote Side-Channel Attacks on Heterogeneous SoC. CARDIS (2019)
Mounia Kharbouche-Harrari, Romain Wacquez, Gregory di Pendina, Jean-Max Dutertre, Jérémy Postel-Pellerin, Driss Aboulkassimi, Jean-Michel Portal
Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM. IOLTS (2019)
Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller. HOST (2019)
Joseph Gravellier, Jean-Max Dutertre, Yannick Teglia, Philippe Loubet-Moundi
High-Speed Ring Oscillator based Sensors for Remote Side-Channel Attacks on FPGAs. ReConFig (2019)
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC (2018)
Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS (2018)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos
Assessing body built-in current sensors for detection of multiple transient faults. Microelectron. Reliab. (2018)
Brice Colombier, Alexandre Menu, Jean-Max Dutertre, Pierre-Alain Moëllic, Jean-Baptiste Rigaud, Jean-Luc Danger
Laser-induced Single-bit Faults in Flash Memory: Instructions Corruption on a 32-bit Microcontroller. IACR Cryptol. ePrint Arch. 2018 (2018)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD (2018)
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
Importance of IR drops on the modeling of laser-induced transient faults. SMACD (2017)
Raphael Andreoni Camponogara Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue
Method for evaluation of transient-fault detection techniques. Microelectron. Reliab. (2017)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation. DSD (2017)
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Assia Tria
Photonic Power Firewalls. The New Codebreakers (2016)
Noemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe Maurine
Body Biasing Injection Attacks in Practice. CS2@HiPEAC (2016)
Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener
On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults. DATE (2016)
Stephan De Castro, Jean-Max Dutertre, Bruno Rouzeyre, Giorgio Di Natale, Marie-Lise Flottes
Frontside Versus Backside Laser Injection: A Comparative Study. ACM J. Emerg. Technol. Comput. Syst. 13 (1) (2016)
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. Microelectron. Reliab. 55 (9-10) (2015)
Stephan De Castro, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Jean-Max Dutertre
Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits. ISVLSI (2015)
Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre
Influence of triple-well technology on laser fault injection and laser sensor efficiency. DFTS (2015)
Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. IRPS (2015)
Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. IOLTS (2015)
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS (2015)
Loïc Zussa, Ingrid Exurville, Jean-Max Dutertre, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria, Jessy Clédière
Evidence of an information leakage between logically independent blocks. CS2@HiPEAC (2015)
Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. DFTS (2015)
Paolo Maistri, Régis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart
Electromagnetic analysis and fault injection onto secure circuits. VLSI-SoC (2014)
Sébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe Maurine
Evidence of a Larger EM-Induced Fault Model. CARDIS (2014)
Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC (2014)
Jean-Max Dutertre, Stephan De Castro, Alexandre Sarafianos, Noemie Boher, Bruno Rouzeyre, Mathieu Lisart, Joel Damiens, Philippe Candelier, Marie-Lise Flottes, Giorgio Di Natale
Laser attacks on integrated circuits: From CMOS to FD-SOI. DTIS (2014)
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54 (9-10) (2014)
Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Bruno Robisson
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter. HOST (2014)
Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) (2014)
Loïc Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia Tria
Efficiency of a glitch detector against electromagnetic fault injection. DATE (2014)
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
A bulk built-in sensor for detection of fault attacks. HOST (2013)
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectron. Reliab. 53 (9-11) (2013)
Amine Dehbaoui, Amir-Pasha Mirbaha, Nicolas Moro, Jean-Max Dutertre, Assia Tria
Electromagnetic Glitch on the AES Round Counter. COSADE (2013)
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS (2013)
Cyril Roscian, Alexandre Sarafianos, Jean-Max Dutertre, Assia Tria
Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells. FDTC (2013)
Alexandre Sarafianos, Cyril Roscian, Jean-Max Dutertre, Mathieu Lisart, Assia Tria
Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. Microelectron. Reliab. 53 (9-11) (2013)
Ingrid Exurville, Jacques J. A. Fournier, Jean-Max Dutertre, Bruno Robisson, Assia Tria
Practical measurements of data path delays for IP authentication & integrity verification. ReCoSoC (2013)
Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria
Robustness improvement of an SRAM cell against laser-induced fault injection. DFTS (2013)
Loïc Zussa, Jean-Max Dutertre, Jessy Clédière, Assia Tria
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism. IOLTS (2013)
Cyril Roscian, Jean-Max Dutertre, Assia Tria
Frontside laser fault injection on cryptosystems - Application to the AES' last round -. HOST (2013)
Amir-Pasha Mirbaha, Jean-Max Dutertre, Assia Tria
Differential analysis of Round-Reduced AES faulty ciphertexts. DFTS (2013)
Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria, Thierry Vaschalde
Fault Round Modification Analysis of the advanced encryption standard. HOST (2012)
Ronan Lashermes, Guillaume Reymond, Jean-Max Dutertre, Jacques J. A. Fournier, Bruno Robisson, Assia Tria
A DFA on AES Based on the Entropy of Error Distributions. FDTC (2012)
Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, Assia Tria
Electromagnetic Transient Faults Injection on a Hardware and a Software Implementations of AES. FDTC (2012)
Alexandre Sarafianos, Roxane Llido, Jean-Max Dutertre, Olivier Gagliano, Valerie Serradeil, Mathieu Lisart, Vincent Goubier, Assia Tria, Vincent Pouget, Dean Lewis
Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. Microelectron. Reliab. 52 (9-10) (2012)
Amine Dehbaoui, Jean-Max Dutertre, Bruno Robisson, P. Orsatelli, Philippe Maurine, Assia Tria
Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-. IACR Cryptol. ePrint Arch. 2012 (2012)
Jacques J. A. Fournier, Jean-Baptiste Rigaud, Sylvain Bouquet, Bruno Robisson, Assia Tria, Jean-Max Dutertre, Michel Agoyan
Design and characterisation of an AES chip embedding countermeasures. Int. J. Intell. Eng. Informatics 1 (3/4) (2011)
Marion Doulcier-Verdier, Jean-Max Dutertre, Jacques J. A. Fournier, Jean-Baptiste Rigaud, Bruno Robisson, Assia Tria
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values. ISSCC (2011)
Michel Agoyan, Jean-Max Dutertre, David Naccache, Bruno Robisson, Assia Tria
When Clocks Fail: On Critical Paths and Clock Faults. CARDIS (2010)
Michel Agoyan, Jean-Max Dutertre, Amir-Pasha Mirbaha, David Naccache, Anne-Lise Ribotta, Assia Tria
How to flip a bit? IOLTS (2010)

Jean-Max Dutertre.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Jean-Max Dutertre