Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS.
Jean-Max DutertreRodrigo Possamai BastosOlivier PotinMarie-Lise FlottesBruno RouzeyreGiorgio Di NataleAlexandre SarafianosPublished in: Microelectron. Reliab. (2014)