Rodrigo Possamai Bastos

Publication Activity (10 Years)

Years Active: 2005-2021
Publications (10 Years): 22

Top Topics

False Positives

Asynchronous Circuits

Fault Detection

Estimation Algorithm

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Publications

J. P. Brum, T. Kraemer Sartori, J. Lin, Matheus Garay Trindade, H. Fourati, R. Velazco, Rodrigo Possamai Bastos
Evaluation of Attitude Estimation Algorithm under Soft Error Effects. LATS (2021)
Fabrice Pancher, Vanessa Vargas, Pablo Ramos, Rodrigo Possamai Bastos, David César Ardiles Saravia, Raoul Velazco
Nanosatellite On-Board Computer including a Many-Core Processor. LATS (2021)
Ricardo Aquino Guazzelli, Matheus Garay Trindade, Leonel Acunha Guimaraes, Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos
Trojan Detection Test for Clockless Circuits. J. Electron. Test. 36 (1) (2020)
Matheus Garay Trindade, Rodrigo Possamai Bastos, Rafael Garibotti, Luciano Ost, Manon Letiche, Jerôme Beaucour
Assessment of Machine Learning Algorithms for Near-Sensor Computing under Radiation Soft Errors. ICECS (2020)
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (6) (2020)
Laurent Fesquet, Yoan Decoudu, Alexis Rodrigo Iga Jadue, Thiago Ferreira de Paiva Leite, Otto Aureliano Rolloff, M. Diallo, Rodrigo Possamai Bastos, Katell Morin-Allory, Sylvain Engels
A Distributed Body-Biasing Strategy for Asynchronous Circuits. VLSI-SoC (2019)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos
Assessing body built-in current sensors for detection of multiple transient faults. Microelectron. Reliab. (2018)
Thiago Ferreira de Paiva Leite, Laurent Fesquet, Rodrigo Possamai Bastos
A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. Microelectron. Reliab. (2018)
Rodrigo Possamai Bastos, Leonel Acunha Guimaraes, Frank Sill Torres, Laurent Fesquet
Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits. Microelectron. J. 71 (2018)
Alexis Rodrigo Iga Jadue, Rodrigo Possamai Bastos, Thiago Ferreira de Paiva Leite, Otto Aureliano Rolloff, M. Diallo, Laurent Fesquet
Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems. ISCAS (2018)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits. ISPD (2018)
Leonel Acunha Guimaraes, Thiago Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Laurent Fesquet
Non-intrusive testing technique for detection of Trojans in asynchronous circuits. DATE (2018)
Jean Simatic, Abdelkarim Cherkaoui, François Bertrand, Rodrigo Possamai Bastos, Laurent Fesquet
A Practical Framework for Specification, Verification, and Design of Self-Timed Pipelines. ASYNC (2017)
Raphael Andreoni Camponogara Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
Importance of IR drops on the modeling of laser-induced transient faults. SMACD (2017)
Raphael Andreoni Camponogara Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue
Method for evaluation of transient-fault detection techniques. Microelectron. Reliab. (2017)
Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation. DSD (2017)
Leonel Acunha Guimaraes, Rodrigo Possamai Bastos, Laurent Fesquet
Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors. ISVLSI (2017)
Raphael de Oliveira Rocha, Frank Sill Torres, Rodrigo Possamai Bastos
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors. Microelectron. Reliab. 78 (2017)
Leonel Acunha Guimaraes, Rodrigo Possamai Bastos, Thiago Ferreira de Paiva Leite, Laurent Fesquet
Simple tri-state logic Trojans able to upset properties of ring oscillators. DTIS (2016)
Jean Simatic, Abdelkarim Cherkaoui, Rodrigo Possamai Bastos, Laurent Fesquet
New asynchronous protocols for enhancing area and throughput in bundled-data pipelines. SBCCI (2016)
Jean Simatic, Rodrigo Possamai Bastos, Laurent Fesquet
High-level synthesis for event-based systems. EBCCSP (2016)
Thiago Ferreira de Paiva Leite, Rodrigo Possamai Bastos, Rodrigo Iga Jadue, Laurent Fesquet
Comparison of low-voltage scaling in synchronous and asynchronous FD-SOI circuits. PATMOS (2016)
Otto Aureliano Rolloff, Rodrigo Possamai Bastos, Laurent Fesquet
Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology. Microelectron. Reliab. 55 (9-10) (2015)
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54 (9-10) (2014)
Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Feng Lu, Bruno Rouzeyre
A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic. J. Electron. Test. 29 (3) (2013)
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
A bulk built-in sensor for detection of fault attacks. HOST (2013)
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale
Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection. Microelectron. Reliab. 53 (9-11) (2013)
Rodrigo Possamai Bastos, Frank Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre
A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. PATMOS (2013)
Frank Sill Torres, Rodrigo Possamai Bastos
Robust modular Bulk Built-in Current Sensors for detection of transient faults. SBCCI (2012)
Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode. Microelectron. Reliab. 52 (9-10) (2012)
Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies. DFT (2011)
Rodrigo Possamai Bastos, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre
Timing issues for an efficient use of concurrent error detection codes. LATW (2011)
Rodrigo Possamai Bastos, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis
Evaluating transient-fault effects on traditional C-element's implementations. IOLTS (2010)
Rodrigo Possamai Bastos, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis
Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies. Microelectron. Reliab. 50 (9-11) (2010)
Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis
Design of a soft-error robust microprocessor. Microelectron. J. 40 (7) (2009)
Rodrigo Possamai Bastos, Yannick Monnet, Gilles Sicard, Fernanda Lima Kastensmidt, Marc Renaudin, Ricardo Reis
Comparing transient-fault effects on synchronous and on asynchronous circuits. IOLTS (2009)
Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis
Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates. SBCCI (2006)
Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis
Design of a Robust 8-Bit Microprocessor to Soft Errors. IOLTS (2006)
Rodrigo Possamai Bastos, Fernanda Lima Kastensmidt, Ricardo Reis
Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory. PATMOS (2005)