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Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies.

Rodrigo Possamai BastosGilles SicardFernanda Lima KastensmidtMarc RenaudinRicardo Reis
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • asynchronous circuits
  • long duration
  • delay insensitive
  • process algebra
  • model checking
  • transaction model
  • data mining
  • vlsi circuits
  • databases
  • computer simulation