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Evaluating transient-fault effects on traditional C-element's implementations.

Rodrigo Possamai BastosGilles SicardFernanda Lima KastensmidtMarc RenaudinRicardo Reis
Published in: IOLTS (2010)
Keyphrases
  • fault diagnosis
  • steady state
  • fault detection
  • failure modes
  • multiscale
  • image processing
  • data model
  • computer based instruction
  • negative effects