FAILURE MODES
Experts
- Hu-Chen Liu
- Sudhakar M. Reddy
- Kai Meng Tay
- Irith Pomeranz
- Cheng-Wen Wu
- Anthony A. Maciejewski
- Wenyan Song
- Genbao Zhang
- Kwai-Sang Chin
- Chee Peng Lim
- Wen Jiang
- Kuo-Qin Yan
- Marc Zeller
- Jian-Xin You
- Yan Ran
- Yongchuan Tang
- Michael G. Pecht
- Kuei-Hu Chang
- Christophe Bérenguer
- Yong Deng
- Xinyang Deng
- Saeid Jafarzadeh Ghoushchi
- Chris J. Price
- Domenico Cotroneo
- Ying-Ming Wang
- Janusz Sosnowski
- Enrico Zio
- Gregory Levitin
- Wu-Tung Cheng
- Long Liu
- Stéphane Lefebvre
- Lars Grunske
- Mariëlle Stoelinga
- Hamid Jahanian
- Hossein Sayyadi Tooranloo
- Xin Yang
- Rachid Guerraoui
- Feng Lu
- Régis Leveugle
Venues
- CoRR
- Reliab. Eng. Syst. Saf.
- IEEE Access
- Sensors
- Microelectron. Reliab.
- IEEE Trans. Reliab.
- ITC
- Comput. Ind. Eng.
- Qual. Reliab. Eng. Int.
- Appl. Soft Comput.
- Expert Syst. Appl.
- Entropy
- J. Intell. Fuzzy Syst.
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Ind. Electron.
- Remote. Sens.
- SAFECOMP
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- IEEE Trans. Computers
- ETFA
- Soft Comput.
- Symmetry
- IEEE Trans. Instrum. Meas.
- ICSRS
- Eng. Appl. Artif. Intell.
- Adv. Eng. Informatics
- ISCAS
- FDTC
- ISSRE Workshops
- IECON
- DFT
- Int. J. Syst. Assur. Eng. Manag.
- ICC
- ISGT
- J. Intell. Manuf.
- ISGT Europe
- IEEE Trans. Smart Grid
- ISSRE
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