FAILURE MODES
Experts
- Hu-Chen Liu
- Sudhakar M. Reddy
- Irith Pomeranz
- Kai Meng Tay
- Cheng-Wen Wu
- Anthony A. Maciejewski
- Wenyan Song
- Kwai-Sang Chin
- Yongchuan Tang
- Jian-Xin You
- Kuo-Qin Yan
- Chee Peng Lim
- Yan Ran
- Wen Jiang
- Marc Zeller
- Genbao Zhang
- Ying-Ming Wang
- Yong Deng
- Xinyang Deng
- Lars Grunske
- Saeid Jafarzadeh Ghoushchi
- Kuei-Hu Chang
- Mariëlle Stoelinga
- Stéphane Lefebvre
- Wu-Tung Cheng
- Janusz Sosnowski
- Domenico Cotroneo
- Christophe Bérenguer
- Gregory Levitin
- Enrico Zio
- Michael G. Pecht
- Hamid Jahanian
- Long Liu
- Chris J. Price
- Michele Zorzi
- Enrico Vicario
- Dong Li
- Jeffrey M. Voas
- Mohammad Khazaeili
Venues
- CoRR
- Reliab. Eng. Syst. Saf.
- Sensors
- IEEE Access
- Microelectron. Reliab.
- IEEE Trans. Reliab.
- ITC
- Comput. Ind. Eng.
- Qual. Reliab. Eng. Int.
- Appl. Soft Comput.
- Expert Syst. Appl.
- Entropy
- J. Intell. Fuzzy Syst.
- IACR Cryptol. ePrint Arch.
- Remote. Sens.
- IEEE Trans. Ind. Electron.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- SAFECOMP
- IEEE Trans. Computers
- VTS
- Symmetry
- ETFA
- Eng. Appl. Artif. Intell.
- Soft Comput.
- ICSRS
- IEEE Trans. Instrum. Meas.
- ISCAS
- Adv. Eng. Informatics
- DFT
- FDTC
- ISSRE Workshops
- IECON
- ICC
- Int. J. Syst. Assur. Eng. Manag.
- ISGT
- J. Intell. Manuf.
- CDC
- COMPSAC
- J. Comput. Phys.
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