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Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits.
Rodrigo Possamai Bastos
Leonel Acunha Guimaraes
Frank Sill Torres
Laurent Fesquet
Published in:
Microelectron. J. (2018)
Keyphrases
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integrated circuit
built in self test
detection algorithm
detection method
fault diagnosis
false alarms
detection accuracy
real time
false positives
detection rate
object detection
expert systems
steady state
printed circuit boards