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A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies.

Rodrigo Possamai BastosGiorgio Di NataleMarie-Lise FlottesBruno Rouzeyre
Published in: DFT (2011)
Keyphrases
  • long duration
  • mobile devices
  • software development
  • object oriented
  • multi dimensional
  • data collection
  • computer simulation
  • business process
  • vlsi circuits