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A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies.
Rodrigo Possamai Bastos
Giorgio Di Natale
Marie-Lise Flottes
Bruno Rouzeyre
Published in:
DFT (2011)
Keyphrases
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long duration
mobile devices
software development
object oriented
multi dimensional
data collection
computer simulation
business process
vlsi circuits