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A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic.

Rodrigo Possamai BastosGiorgio Di NataleMarie-Lise FlottesFeng LuBruno Rouzeyre
Published in: J. Electron. Test. (2013)
Keyphrases
  • long duration
  • databases
  • fault diagnosis
  • transaction model
  • data structure
  • query language
  • mobile phone
  • error detection