ERROR DETECTION
Experts
- Pedro Reviriego
- Torleiv Kløve
- Neri Merhav
- Shu Lin
- Juan Antonio Maestro
- Ramesh Karri
- Venkatesan Guruswami
- B. Sundar Rajan
- Antonia Wachter-Zeh
- Bella Bose
- Subhasish Mitra
- Warren J. Gross
- Abhijit Chatterjee
- Fabrizio Lombardi
- Bane V. Vasic
- Sudhakar M. Reddy
- Jacob A. Abraham
- Hwee Tou Ng
- Irith Pomeranz
- Khaled A. S. Abdel-Ghaffar
- Sven Puchinger
- Matteo Sonza Reorda
- Mamoru Komachi
- Lajos Hanzo
- Mark G. Karpovsky
- Joel R. Tetreault
- Michael Gössel
- Eiji Fujiwara
- Carlo Condo
- Krishnendu Chakrabarty
- Martin Bossert
- Alexander Barg
- Dhiraj K. Pradhan
- Yiorgos Makris
- W. Kent Fuchs
- Gilles Zémor
- Trieu-Kien Truong
- Jehoshua Bruck
- Paul H. Siegel
Venues
- CoRR
- IEEE Trans. Inf. Theory
- ISIT
- IEEE Trans. Commun.
- IEEE Trans. Computers
- IEEE Commun. Lett.
- IEEE Access
- DFT
- ISCAS
- ICASSP
- GLOBECOM
- IOLTS
- DATE
- ICC
- IEEE Trans. Very Large Scale Integr. Syst.
- Des. Codes Cryptogr.
- ITW
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IACR Cryptol. ePrint Arch.
- FTCS
- DSN
- ITC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Sensors
- INTERSPEECH
- Quantum Inf. Process.
- IEEE Trans. Instrum. Meas.
- VTS
- PIMRC
- ISITA
- IEEE Trans. Ind. Electron.
- WCNC
- IEEE Trans. Circuits Syst. II Express Briefs
- DAC
- J. Electron. Test.
- IET Commun.
- Microelectron. Reliab.
- ICRA
- EUSIPCO
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