Michael Gössel

Publication Activity (10 Years)

Years Active: 1969-2024
Publications (10 Years): 6

Top Venues

IOLTS

ARCS

ETS

J. Autom. Lang. Comb.

Publications

Alexander Benedict Behrens, Michael Gössel
Determination of Optimal H-Matrices for 2-Bit Error Correcting Codes. ARCS (2024)
Georg Duchrau, Michael Gössel
Modified Cross Parity Codes for Adjacent Double Error Correction. ARCS (2023)
Paul-Patrick Nordmann, Michael Gössel
A New DEC/TED Code for Fast Correction of 2-Bit-Errors. IOLTS (2019)
Paul-Patrick Nordmann, Michael Gössel
Regular LPDC Codes with Guaranteed Minimal Hamming Distance. J. Autom. Lang. Comb. 23 (1-3) (2018)
A. Klockmann, Georg Georgakos, Michael Gössel
A new 3-bit burst-error correcting code. IOLTS (2017)
Günther Nieß, Thomas Kern, Michael Gössel
Möglichkeiten der Modellierung von Fehlern in MLC-Flash-Speichern durch Fehlergraphen. GI-Jahrestagung (2015)
Christian Badack, Michael Gössel
Triple error detection for Imai-Kamiyanagi codes based on subsyndrome computations. ETS (2014)
Stefan Weidling, Michael Gössel
Fault tolerant linear state machines. LATW (2014)
Milos Krstic, Stefan Weidling, Vladimir Petrovic, Michael Gössel
Improved circuitry for soft error correction in combinational logic in pipelined designs. IOLTS (2014)
Christian Badack, Thomas Kern, Michael Gössel
Modified DEC BCH codes for parallel correction of 3-bit errors comprising a pair of adjacent errors. IOLTS (2014)
Egor S. Sogomonyan, Stefan Weidling, Michael Gössel
A new method for correcting time and soft errors in combinational circuits. DDECS (2013)
Stefan Weidling, Egor S. Sogomonyan, Michael Gössel
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD (2013)
Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel
Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (6) (2012)
Michael Augustin, Michael Gössel, Rolf Kraemer
Implementation of Selective Fault Tolerance with conventional synthesis tools. DDECS (2011)
Thomas Rabenalt, Michael Gössel, Andreas Leininger
Masking of X-Values by Use of a Hierarchically Configurable Register. J. Electron. Test. 27 (1) (2011)
Michael Augustin, Michael Gössel, Rolf Kraemer
Selective fault tolerance for finite state machines. IOLTS (2011)
Thomas Rabenalt, Michael Richter, Michael Gössel
High Performance Compaction for Test Responses with Many Unknowns. Asian Test Symposium (2010)
Michael Augustin, Michael Gössel, Rolf Kraemer
Reducing the area overhead of TMR-systems by protecting specific signals. IOLTS (2010)
Michael Richter, Michael Gössel
Concurrent checking with split-parity codes. IOLTS (2009)
Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25 (4-5) (2009)
Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. ETS (2009)
Thomas Rabenalt, Michael Gössel, Andreas Leininger
Masking of X-values by Use of a Hierarchically Configurable Register. ETS (2009)
Michael Gössel, Egor S. Sogomonyan
A Non-linear Split Error Detection Code. Fundam. Informaticae 83 (1-2) (2008)
Michael Richter, Klaus Oberländer, Michael Gössel
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability. IOLTS (2008)
Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel
Accelerated Shift Registers for X-tolerant Test Data Compaction. ETS (2008)
Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. ITC (2007)
Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel
On-chip evaluation, compensation and storage of scan diagnosis data. IET Comput. Digit. Tech. 1 (3) (2007)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
=3 Checking for a Carry Select Adder. J. Electron. Test. 22 (1) (2006)
Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel
Test set enrichment using a probabilistic fault model and the theory of output deviations. DATE (2006)
Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz
On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. ETS (2006)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS (2006)
Vitalij Ocheretnij, G. Kouznetsov, Ramesh Karri, Michael Gössel
On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. IOLTS (2005)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium (2005)
Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE (2004)
Kaijie Wu, Ramesh Karri, Grigori Kuznetsov, Michael Gössel
Low Cost Concurrent Error Detection for the Advanced Encryption Standard. ITC (2004)
Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS (2004)
Andreas Leininger, Michael Gössel, Peter Muhmenthaler
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code. DATE (2004)
Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops (2004)
V. V. Saposhnikov, Vl. V. Saposhnikov, A. Morozov, Michael Gössel
Necessary and Sufficient Conditions for the Existence of Totally Self-Checking Circuits. IOLTS (2004)
A. Morozov, Michael Gössel, V. V. Saposhnikov, Vl. V. Saposhnikov
Complementary Circuits for On-Line Detection for 1-out-of-3 Codes. ARCS Workshops (2004)
Michael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electron. Test. 20 (6) (2004)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS (2004)
Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8 (4) (2003)
Ramesh Karri, Grigori Kuznetsov, Michael Gössel
Parity-Based Concurrent Error Detection of Substitution-Permutation Network Block Ciphers. CHES (2003)
Ramesh Karri, Grigori Kuznetsov, Michael Gössel
Parity-Based Concurrent Error Detection in Symmetric Block Ciphers. ITC (2003)
Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS (2003)
Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel
Zero-Aliasing Space Compaction of Test Responses Using a Single Periodic Output. IEEE Trans. Computers 52 (12) (2003)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
A Modulo p Checked Self-Checking Carry Select Adder. IOLTS (2003)
Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT (2002)
Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel
An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. DATE (2002)
Michael Gössel, Egor S. Sogomonyan, Adit D. Singh
Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS (2002)
Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty
Synthesis of single-output space compactors for scan-based sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (10) (2002)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW (2002)
Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty
Robust Space Compaction of Test Responses. Asian Test Symposium (2002)
Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium (2001)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW (2001)
Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel, Krishnendu Chakrabarty
Synthesis of single-output space compactors with application to scan-based IP cores. ASP-DAC (2001)
Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS (2001)
A. Morozov, Michael Gössel, Krishnendu Chakrabarty, Bhargab B. Bhattacharya
Design of Parameterizable Error-Propagating Space Compactors for Response Observation. VTS (2001)
Michael Gössel, Vitalij Ocheretnij, S. Chakrabarty
Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. Asian Test Symposium (2001)
Michael Gössel, Alexej Dmitriev, Vl. V. Saposhnikov, V. V. Saposhnikov
A New Method for Concurrent Checking by Use of a 1-out-of-4 Code. IOLTW (2000)
Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel
Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW (2000)
A. Morozov, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel
New Self-Checking Circuits by Use of Berger-Codes. IOLTW (2000)
Vitalij Ocheretnij, Michael Gössel, Vl. V. Saposhnikov, V. V. Saposhnikov
A New Method of Redundancy Addition for Circuit Optimization. EUROMICRO (2000)
Bhargab B. Bhattacharya, Alexej Dmitriev, Michael Gössel
Zero-Aliasing Space Compression using a Single Periodic Output and its Application to Testing of Embedded Cores. VLSI Design (2000)
Alexej Dmitriev, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov
New Self-dual Circuits for Error Detection and Testing. VLSI Design 2000 (1) (2000)
Vl. V. Saposhnikov, V. Moshanin, V. V. Saposhnikov, Michael Gössel
Experimental Results for Self-Dual Multi-Output Combinational Circuits. J. Electron. Test. 14 (3) (1999)
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15 (1-2) (1999)
Markus Seuring, Michael Gössel
A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. WIA (1999)
Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC (1999)
Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS (1999)
Markus Seuring, Michael Gössel
A Structural Approach for Space Compaction for Sequential Circuits. DFT (1999)
Vl. V. Saposhnikov, V. V. Saposhnikov, Alexej Dmitriev, Michael Gössel
Self-Dual Duplication for Error Detection. Asian Test Symposium (1998)
V. V. Saposhnikov, Andrej A. Morosov, Vl. V. Saposhnikov, Michael Gössel
A New Design Method for Self-Checking Unidirectional Combinational Circuits. J. Electron. Test. 12 (1-2) (1998)
Markus Seuring, Michael Gössel, Egor S. Sogomonyan
A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS (1998)
T. Bogue, Michael Gössel, Helmut Jürgensen, Yervant Zorian
Built-In Self-Test with an Alternating Output. DATE (1998)
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS (1998)
Sebastian T. J. Fenn, Michael Gössel, Mohammed Benaissa, David Taylor
On-Line Error Detection for Bit-Serial Multipliers in GF(2m). J. Electron. Test. 13 (1) (1998)
A. Morosow, V. V. Saposhnikov, Vl. V. Saposhnikov, Michael Gössel
Self-Checking Combinational Circuits with Unidirectionally Independent Outputs. VLSI Design 1998 (4) (1998)
Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan
Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium (1997)
Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan
A linear code-preserving signature analyzer COPMISR. VTS (1997)
Michael Gössel, Sebastian T. J. Fenn, David Taylor
On-line error detection for finite field multipliers. DFT (1997)
Vl. V. Saposhnikov, Alexej Dmitriev, Michael Gössel, V. V. Saposhnikov
Self-dual parity checking-A new method for on-line testing. VTS (1996)
Michael Gössel, Egor S. Sogomonyan
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. 8 (2) (1996)
Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45 (3) (1996)
Egor S. Sogomonyan, Michael Gössel
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS (1996)
T. Bogue, Helmut Jürgensen, Michael Gössel
BIST with negligible aliasing through random cover circuits. ASP-DAC (1995)
Stefan Gerber, Michael Gössel
Detection of Permanent Hardware Faults of a Floating Point Adder by Pseudoduplication. EDCC (1994)
T. Bogue, Helmut Jürgensen, Michael Gössel
Design of Cover Circuits for Monitoring the Output of a MISA. DFT (1994)
Michael Gössel, Egor S. Sogomonyan
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS (1994)
Egor S. Sogomonyan, Michael Gössel
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT (1993)
Egor S. Sogomonyan, Michael Gössel
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. 4 (3) (1993)
Michael Gössel, Egor S. Sogomonyan
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI (1993)
Michael Gössel, Helmut Jürgensen
Monitoring BIST by covers. EURO-DAC (1993)
Egor S. Sogomonyan, Michael Gössel
Self-testing and self-checking combinational circuits with weakly independent outputs. VTS (1992)
Wolfgang Hahn, Michael Gössel
Pseudoduplication of floating-point addition. A method of compiler generated checking of permanent hardware faults. VTS (1991)
Michael Gössel
Optimal Error Detection Circuits for Sequential Circuits with Observable States. Fault-Tolerant Computing Systems (1991)
Michael Gössel, J. Saedler
Parallel computing of line-codings by use of a display processor system and the parallel determination of a discrete curvature. Recent Issues in Pattern Analysis and Recognition (1989)
Rolf-Jürgen Vilser, Reiner Creutzburg, Hans-Jörg Grundmann, Michael Gössel
Parallel matrix multiplication on an array-logical processor. Recent Issues in Pattern Analysis and Recognition (1989)
Wolfgang Luth, Michael Gössel
Linear image operations on the A6472 image processing system by use of the residue arithmetics. Recent Issues in Pattern Analysis and Recognition (1989)

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Publication Activity (10 Years)

Top Topics

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Michael Gössel