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New Self-dual Circuits for Error Detection and Testing.
Alexej Dmitriev
V. V. Saposhnikov
Vl. V. Saposhnikov
Michael Gössel
V. Moshanin
Andrej A. Morosov
Published in:
VLSI Design (2000)
Keyphrases
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error detection
error correction
error recovery
error correcting
data cleansing
fault tolerance
error resilient
high speed
error control
fault isolation
fault tolerant
fuzzy logic
distributed systems
digital circuits
delay insensitive
logic synthesis