DIGITAL CIRCUITS
Experts
- Rolf Drechsler
- Robert Wille
- Abhijit Chatterjee
- Georges G. E. Gielen
- Jacob A. Abraham
- Irith Pomeranz
- Raimund Ubar
- Chris J. Myers
- Lukás Sekanina
- Alberto L. Sangiovanni-Vincentelli
- Kaushik Roy
- Massoud Pedram
- Tetsuya Higuchi
- Sudhakar M. Reddy
- Vishwani D. Agrawal
- David Z. Pan
- Giovanni De Micheli
- Lars Hedrich
- Xin Li
- Radomir S. Stankovic
- Bozena Kaminska
- Jaan Raik
- David T. Blaauw
- Marek A. Perkowski
- Dennis Sylvester
- Sachin S. Sapatnekar
- Didier Keymeulen
- Robert K. Brayton
- Sule Ozev
- Ranga Vemuri
- Leon O. Chua
- Haralampos-G. D. Stratigopoulos
- D. Michael Miller
- Nina Yevtushenko
- Mathias Soeken
- Yiorgos Makris
- Tsutomu Sasao
- Ramesh Harjani
- Johannes Schemmel
Venues
- CoRR
- ISCAS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DAC
- IEEE J. Solid State Circuits
- ICECS
- DATE
- VLSI Design
- ICCAD
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Computers
- ITC
- ISMVL
- ASP-DAC
- IEEE Trans. Circuits Syst. II Express Briefs
- J. Electron. Test.
- ICCD
- CICC
- Microelectron. J.
- IEEE Access
- MWSCAS
- Integr.
- ISQED
- J. Circuits Syst. Comput.
- VTS
- IEICE Trans. Electron.
- IACR Cryptol. ePrint Arch.
- Int. J. Circuit Theory Appl.
- ISSCC
- Electron. Colloquium Comput. Complex.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ACM Great Lakes Symposium on VLSI
- IEEE Trans. Instrum. Meas.
- ISVLSI
- J. Symb. Log.
- Microelectron. Reliab.
- ICES
- IEICE Electron. Express
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