Egor S. Sogomonyan

Publication Activity (10 Years)

Years Active: 1992-2020
Publications (10 Years): 2

Top Topics

Error Detection

Asynchronous Circuits

Top Venues

Microelectron. Reliab.

J. Circuits Syst. Comput.

Publications

Mehmed Dug, Stefan Weidling, Egor S. Sogomonyan, Dejan Jokic, Milos Krstic
Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches. J. Circuits Syst. Comput. 29 (13) (2020)
Milos Krstic, Stefan Weidling, Vladimir Petrovic, Egor S. Sogomonyan
Enhanced architectures for soft error detection and correction in combinational and sequential circuits. Microelectron. Reliab. 56 (2016)
Egor S. Sogomonyan, Stefan Weidling, Michael Gössel
A new method for correcting time and soft errors in combinational circuits. DDECS (2013)
Stefan Weidling, Egor S. Sogomonyan, Michael Gössel
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD (2013)
Michael Gössel, Egor S. Sogomonyan
A Non-linear Split Error Detection Code. Fundam. Informaticae 83 (1-2) (2008)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
=3 Checking for a Carry Select Adder. J. Electron. Test. 22 (1) (2006)
Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande
On-line Fault Detection and Location for NoC Interconnects. IOLTS (2006)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS (2006)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium (2005)
Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE (2004)
Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS (2004)
Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel
Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops (2004)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS (2004)
Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8 (4) (2003)
Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS (2003)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
A Modulo p Checked Self-Checking Carry Select Adder. IOLTS (2003)
Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT (2002)
Michael Gössel, Egor S. Sogomonyan, Adit D. Singh
Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS (2002)
Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW (2002)
Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium (2001)
Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW (2001)
Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS (2001)
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15 (1-2) (1999)
Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC (1999)
Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS (1999)
Markus Seuring, Michael Gössel, Egor S. Sogomonyan
A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS (1998)
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS (1998)
Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan
Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium (1997)
Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan
A linear code-preserving signature analyzer COPMISR. VTS (1997)
Michael Gössel, Egor S. Sogomonyan
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. 8 (2) (1996)
Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45 (3) (1996)
Egor S. Sogomonyan, Michael Gössel
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS (1996)
Michael Gössel, Egor S. Sogomonyan
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS (1994)
Egor S. Sogomonyan, Michael Gössel
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT (1993)
Egor S. Sogomonyan, Michael Gössel
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. 4 (3) (1993)
Michael Gössel, Egor S. Sogomonyan
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI (1993)
Egor S. Sogomonyan, Michael Gössel
Self-testing and self-checking combinational circuits with weakly independent outputs. VTS (1992)