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A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing.
Egor S. Sogomonyan
Adit D. Singh
Michael Gössel
Published in:
J. Electron. Test. (1999)
Keyphrases
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high efficiency
test generation
memory usage
software testing
application specific
real time
statistical tests
hardware software co design
conducted an empirical study
test case generation
test cases
training set
wide range
artificial intelligence
genetic algorithm
data mining
databases