STATISTICAL TESTS
Experts
- Irith Pomeranz
- Krishnendu Chakrabarty
- Sudhakar M. Reddy
- Matteo Sonza Reorda
- Vincent Y. F. Tan
- Michèle A. Wigger
- Janusz Rajski
- Xin Luo
- Hans-Joachim Wunderlich
- Alex Orailoglu
- Sadaf Salehkalaibar
- Vishwani D. Agrawal
- Salvador Mir
- Said Hamdioui
- Abdelhak M. Zoubir
- Ernesto Sánchez
- Venugopal V. Veeravalli
- Weijian Liu
- Ankit Agrawal
- Ad J. van de Goor
- Erik Jan Marinissen
- Yervant Zorian
- Adit D. Singh
- Tara Javidi
- Kwang-Ting Cheng
- Nur A. Touba
- Liang Liang
- Haralampos-G. D. Stratigopoulos
- Deniz Gündüz
- Patrick Kenny
- Paolo Bernardi
- Hideo Fujiwara
- Abhijit Chatterjee
- Jerzy Tyszer
- Li-C. Wang
- Yonglong Li
- Sandeep K. Gupta
- Sungho Kang
- Xiaoqing Wen
Venues
- CoRR
- ITC
- Bioinform.
- Comput. Stat. Data Anal.
- Commun. Stat. Simul. Comput.
- BMC Bioinform.
- VTS
- J. Multivar. Anal.
- IEEE Trans. Inf. Theory
- ICASSP
- J. Electron. Test.
- Eur. J. Oper. Res.
- NeuroImage
- ISIT
- Asian Test Symposium
- IEEE Access
- IEEE Trans. Signal Process.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Des. Test Comput.
- Technometrics
- Entropy
- Sensors
- DATE
- INTERSPEECH
- Microelectron. Reliab.
- Qual. Reliab. Eng. Int.
- Expert Syst. Appl.
- IEEE Trans. Instrum. Meas.
- ETS
- EMBC
- Remote. Sens.
- Appl. Math. Comput.
- Symmetry
- Stat. Comput.
- Briefings Bioinform.
- ICST
- DAC
- Comput. Stat.
- J. Oper. Res. Soc.
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