Paolo Bernardi

ORCID

Publication Activity (10 Years)

Years Active: 1997-2023
Publications (10 Years): 55

Top Venues

Publications

Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11 (2023)
Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
A guided debugger-based fault injection methodology for assessing functional test programs. VTS (2023)
Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. VLSI-SoC (2023)
Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS (2023)
Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. LATS (2023)
Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS (2023)
Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS (2023)
Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72 (5) (2023)
Paolo Bernardi, G. Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, P. Scaramuzza, Rudolf Ullmann
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. ETS (2022)
F. Angione, Paolo Bernardi, G. Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS (2022)
F. Angione, Davide Appello, J. Aribido, J. Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, C. De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, M. Huch, Giusy Iaria, T. Kilian, R. Mariani, R. Martone, Annachiara Ruospo, E. Sanchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, L. Sterpone, Vincenzo Tancorre, Roberto Ugioli
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS (2022)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10 (2022)
Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
A novel SEU injection setup for Automotive SoC. ISIE (2022)
Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS (2022)
Francesco Angione, Paolo Bernardi, A. Calabrese, L. Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An innovative Strategy to Quickly Grade Functional Test Programs. ITC (2022)
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, J. Gomez, Michelangelo Grosso, Andrea Guerriero, I. Guglielminetti, Said Hamdioui, G. Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS (2022)
Vincent Huard, F. Jacquet, Souhir Mhira, Lionel Jure, O. Montfort, M. Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, Nils Exibard, V. Bonnet, A. Charvier, Paolo Bernardi, Riccardo Cantoro
Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode. IRPS (2022)
Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT (2022)
Davide Appello, H. H. Chen, Matthias Sauer, Ilia Polian, Paolo Bernardi, Matteo Sonza Reorda
System-Level Test: State of the Art and Challenges. IOLTS (2021)
Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
Innovative methods for Burn-In related Stress Metrics Computation. DTIS (2021)
Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner
Exploring the Mysteries of System-Level Test. CoRR (2021)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS (2021)
Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti, Giovanni Squillero
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors. IEEE Trans. Emerg. Top. Comput. 8 (2) (2020)
Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit D. Singh, Matteo Sonza Reorda, Stefan Wagner
Exploring the Mysteries of System-Level Test. ATS (2020)
Paolo Bernardi, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, D. Petrali
Applicative System Level Test introduction to Increase Confidence on Screening Quality. DDECS (2020)
Paolo Bernardi, Davide Piumatti, Ernesto Sánchez
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool. LASCAS (2019)
S. Carbonara, Paolo Bernardi, Marco Restifo
A Hybrid In-Field Self-Test Technique for SoCs. DTIS (2019)
A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS (2019)
F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, G. Zoppi
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS (2019)
Paolo Bernardi, Riccardo Cantoro, Andrea Floridia, Davide Piumatti, C. Pogonea, Annachiara Ruospo, Ernesto Sánchez, Sergio de Luca, Alessandro Sansonetti
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. DATE (2019)
Alberto Bosio, Paolo Bernardi, Annachiara Ruospo, Ernesto Sánchez
A Reliability Analysis of a Deep Neural Network. LATS (2019)
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray
Scan-Chain Intra-Cell Aware Testing. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. J. Low Power Electron. 14 (1) (2018)
Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini
Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. J. Electron. Test. 34 (1) (2018)
Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini
An Optimized Test During Burn-In for Automotive SoC. IEEE Des. Test 35 (3) (2018)
Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner
Robustness in automotive electronics: An industrial overview of major concerns. IOLTS (2017)
Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini
A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. DATE (2017)
G. Harcha, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi
An effective fault-injection framework for memory reliability enhancement perspectives. DTIS (2017)
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
Microprocessor Testing: Functional Meets Structural Test. J. Circuits Syst. Comput. 26 (8) (2017)
Paolo Bernardi, Sergio de Luca, Davide Piumatti, S. Regis, Ernesto Sánchez, Alessandro Sansonetti
On the in-field testing of spare modules in automotive microprocessors. VLSI-SoC (2017)
Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller. LATS (2017)
Paolo Bernardi, Marco Restifo, Ernesto Sánchez, Matteo Sonza Reorda
On the in-field test of embedded memories. IOLTS (2017)
Marco Restifo, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti
On-line software-based self-test for ECC of embedded RAM memories. DFT (2017)
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. ISVLSI (2016)
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
An effective approach for functional test programs compaction. DDECS (2016)
Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS (2016)
Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Ernesto Sánchez, Federico Venini
Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs. VLSI-SoC (Selected Papers) (2016)
Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Federico Venini
Faster-than-at-speed execution of functional programs: An experimental analysis. VLSI-SoC (2016)
Paolo Bernardi, Riccardo Cantoro, Sergio de Luca, Ernesto Sánchez, Alessandro Sansonetti
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers. IEEE Trans. Computers 65 (3) (2016)
Riccardo Cantoro, Davide Piumatti, Paolo Bernardi, Sergio de Luca, Alessandro Sansonetti
In-field functional test programs development flow for embedded FPUs. DFT (2016)
Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
An effective ATPG flow for Gate Delay Faults. DTIS (2015)
Paolo Bernardi, Lyl M. Ciganda Brasca, Matteo Sonza Reorda, Said Hamdioui
SW-based transparent in-field memory testing. LATS (2015)
Paolo Bernardi, C. Bovi, Riccardo Cantoro, Sergio de Luca, Renato Meregalli, Davide Piumatti, Ernesto Sánchez, Alessandro Sansonetti
Software-based self-test techniques of computational modules in dual issue embedded processors. ETS (2015)
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
Scan-chain intra-cell defects grading. DTIS (2015)
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda
Exploring the impact of functional test programs re-used for power-aware testing. DATE (2015)
Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi
A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW (2014)
Paolo Bernardi, Lyl Mercedes Ciganda, Ernesto Sánchez, Matteo Sonza Reorda
MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test. IEEE Trans. Computers 63 (11) (2014)
Andreas Riefert, Lyl M. Ciganda, Matthias Sauer, Paolo Bernardi, Matteo Sonza Reorda, Bernd Becker
An effective approach to automatic functional processor test generation for small-delay faults. DATE (2014)
Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. J. Electron. Test. 30 (3) (2014)
Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Ernesto Sánchez, Matteo Sonza Reorda, Sergio de Luca, Renato Meregalli, Alessandro Sansonetti
On the in-field functional testing of decode units in pipelined RISC processors. DFT (2014)
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi
An intra-cell defect grading tool. DDECS (2014)
Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. J. Low Power Electron. 9 (2) (2013)
Paolo Bernardi, Riccardo Cantoro, Lyl M. Ciganda Brasca, Boyang Du, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors. MTV (2013)
Paolo Bernardi, Lyl M. Ciganda, Matteo Sonza Reorda, Said Hamdioui
An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. Asian Test Symposium (2013)
Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
Increasing fault coverage during functional test in the operational phase. IOLTS (2013)
Paolo Bernardi, Michele Bonazza, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
On-line functionally untestable fault identification in embedded processor cores. DATE (2013)
Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Sánchez
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. IOLTS (2013)
Paolo Bernardi, D. Boyang, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda, Michelangelo Grosso, Oscar Ballan
A functional test algorithm for the register forwarding and pipeline interlocking unit in pipelined microprocessors. IDT (2013)
Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan
On-line software-based self-test of the Address Calculation Unit in RISC processors. ETS (2012)
Paolo Bernardi, Lyl M. Ciganda
An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis. IEEE Trans. Instrum. Meas. 61 (4) (2012)
Paolo Bernardi, Lyl M. Ciganda, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
A SBST strategy to test microprocessors' Branch Target Buffer. DDECS (2012)
Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka
Peak Power Estimation: A Case Study on CPU Cores. Asian Test Symposium (2012)
Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Luciano Bonaria, Roberto Losco, Luciano Marcigot, Maurizio Straiotto
A Parallel Tester Architecture for Accelerometer and Gyroscope MEMS Calibration and Test. J. Electron. Test. 27 (3) (2011)
Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Oscar Ballan
Fault grading of software-based self-test procedures for dependable automotive applications. DATE (2011)
Paolo Bernardi, Lyl M. Ciganda, Ernesto Sánchez, Matteo Sonza Reorda
An effective methodology for on-line testing of embedded microprocessors. IOLTS (2011)
Paolo Bernardi, Matteo Sonza Reorda
A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing. Asian Test Symposium (2011)
Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch
On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. DFT (2011)
Marta Cavagnaro, Claudio Amabile, Paolo Bernardi, Stefano Pisa, Nevio Tosoratti
A Minimally Invasive Antenna for Microwave Ablation Therapies: Design, Performances, and Experimental Assessment. IEEE Trans. Biomed. Eng. 58 (4) (2011)
Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
Optimized embedded memory diagnosis. DDECS (2011)
Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda
An Exact and Efficient Critical Path Tracing Algorithm. DELTA (2010)
Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda
An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. MTV (2010)
Paolo Bernardi, Letícia Maria Veiras Bolzani Poehls, Michelangelo Grosso, Matteo Sonza Reorda
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs. IEEE Trans. Dependable Secur. Comput. 7 (4) (2010)
Oscar Ballan, Paolo Bernardi, Giovanni Fontana, Michelangelo Grosso, Ernesto Sánchez
A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip. MTV (2010)
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Y. Zhang
A programmable BIST for DRAM testing and diagnosis. ITC (2010)
Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
An adaptive tester architecture for volume diagnosis. ETS (2010)
Lyl M. Ciganda Brasca, Paolo Bernardi, Matteo Sonza Reorda, Dimitri Barbieri, Maurizio Straiotto, Luciano Bonaria
A tester architecture suitable for MEMS calibration and testing. ITC (2010)
Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug. IET Comput. Digit. Tech. 4 (2) (2010)
Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone
Cumulative embedded memory failure bitmap display & analysis. DDECS (2010)
Lyl M. Ciganda, Francesco Abate, Paolo Bernardi, M. Bruno, Matteo Sonza Reorda
An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs. DDECS (2009)
Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda
An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS (2009)
Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS (2009)
Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. ETS (2009)
Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. Very Large Scale Integr. Syst. 17 (11) (2009)
C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, Fausto Piazza, Paolo Bernardi
An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS (2009)
Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS (2009)
Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores. MTV (2008)
Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi
SoC Symbolic Simulation: a case study on delay fault testing. DDECS (2008)
Paolo Bernardi, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero, Matteo Sonza Reorda
An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (3) (2008)
Paolo Bernardi, Kyriakos Christou, Michelangelo Grosso, Maria K. Michael, Ernesto Sánchez, Matteo Sonza Reorda
Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors. EvoWorkshops (2008)
Paolo Bernardi, Matteo Sonza Reorda
An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers. DATE (2008)

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Publication Activity (10 Years)

Top Topics

Top Venues

Paolo Bernardi