An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase.
Paolo BernardiLyl M. CigandaMatteo Sonza ReordaSaid HamdiouiPublished in: Asian Test Symposium (2013)
Keyphrases
- experimental evaluation
- high precision
- detection method
- high accuracy
- computational cost
- data sets
- cost function
- memory usage
- segmentation method
- probabilistic model
- significant improvement
- multiresolution
- objective function
- feature selection
- prior knowledge
- preprocessing
- input data
- optimization algorithm
- computational complexity
- synthetic data
- decision making
- embedded systems