Etienne Auvray

Publication Activity (10 Years)

Years Active: 2013-2023
Publications (10 Years): 7

Top Topics

Analog Circuits

Fault Diagnosis

Microscope Images

Top Venues

J. Electron. Test.

Publications

Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications. J. Electron. Test. 39 (2) (2023)
Tommaso Melis, Emmanuel Simeu, Etienne Auvray, Luc Saury
Improved Fault Diagnosis of Analog Circuits using Light Emission Measures. LATS (2021)
Tommaso Melis, Emmanuel Simeu, Luc Saury, Etienne Auvray
Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits. ITC (2021)
Tommaso Melis, Emmanuel Simeu, Etienne Auvray
Automatic Fault Simulators for Diagnosis of Analog Systems. IOLTS (2020)
Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar
Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. IOLTS (2019)
Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, Etienne Auvray
Scan-Chain Intra-Cell Aware Testing. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Etienne Auvray, Paul Armagnat, Luc Saury, Maheshwaran Jothi, Michael Brügel
Effective scan chain failure analysis method. Microelectron. Reliab. (2017)
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Etienne Auvray
Intra-Cell Defects Diagnosis. J. Electron. Test. 30 (5) (2014)
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Etienne Auvray
On the Generation of Diagnostic Test Set for Intra-cell Defects. ATS (2014)
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray
Effect-cause intra-cell diagnosis at transistor level. ISQED (2013)