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Scan-Chain Intra-Cell Aware Testing.
Aymen Touati
Alberto Bosio
Patrick Girard
Arnaud Virazel
Paolo Bernardi
Matteo Sonza Reorda
Etienne Auvray
Published in:
IEEE Trans. Emerg. Top. Comput. (2018)
Keyphrases
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test cases
scan data
neural network
real time
data sets
bayesian networks
expert systems
image analysis
test set
test generation
microscope images