Effective scan chain failure analysis method.
Etienne AuvrayPaul ArmagnatLuc SauryMaheshwaran JothiMichael BrügelPublished in: Microelectron. Reliab. (2017)
Keyphrases
- main contribution
- synthetic data
- detection method
- cost function
- evaluation method
- fully automatic
- high precision
- high accuracy
- spectral analysis
- error rate
- computationally efficient
- data sets
- dynamic programming
- pairwise
- computational complexity
- similarity measure
- neural network
- probabilistic model
- mutual information
- computational cost
- significant improvement
- preprocessing
- training data
- highly efficient