Aida Todri

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 1

Top Topics

Fault Diagnosis

Instruction Set Architecture

Top Venues

Neuromorph. Comput. Eng.

Publications

Stefania Carapezzi, Andrew Plews, Gabriele Boschetto, Ahmed Nejim, Siegfried F. Karg, Aida Todri
How fast can vanadium dioxide neuron-mimicking devices oscillate? Physical mechanisms limiting the frequency of vanadium dioxide oscillators. Neuromorph. Comput. Eng. 3 (3) (2023)
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
Test and diagnosis of power switches. DDECS (2014)
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot
iBoX - Jitter based Power Supply Noise sensor. ETS (2014)
Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. DDECS (2014)
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Asian Test Symposium (2013)
Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. IOLTS (2013)
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. DTIS (2013)
Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. IEEE Trans. Very Large Scale Integr. Syst. 21 (5) (2013)
Aida Todri, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud Virazel
A Study of Tapered 3-D TSVs for Power and Thermal Integrity. IEEE Trans. Very Large Scale Integr. Syst. 21 (2) (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC (2013)
Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Test solution for data retention faults in low-power SRAMs. DATE (2013)
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS (2013)
Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray
Effect-cause intra-cell diagnosis at transistor level. ISQED (2013)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
A built-in scheme for testing and repairing voltage regulators of low-power srams. VTS (2013)
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel
Why and How Controlling Power Consumption during Test: A Survey. Asian Test Symposium (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Coupling-based resistive-open defects in TAS-MRAM architectures. ETS (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Defect analysis in power mode control logic of low-power SRAMs. ETS (2012)
Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné
Evaluation of test algorithms stress effect on SRAMs under neutron radiation. IOLTS (2012)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
Low-power SRAMs power mode control logic: Failure analysis and test solutions. ITC (2012)
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot
Power Supply Noise Sensor Based on Timing Uncertainty Measurements. Asian Test Symposium (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium (2012)
Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
Through-Silicon-Via resistive-open defect analysis. ETS (2012)
D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich
A pseudo-dynamic comparator for error detection in fault tolerant architectures. VTS (2012)
Aida Todri, Malgorzata Marek-Sadowska
Power Delivery for Multicore Systems. IEEE Trans. Very Large Scale Integr. Syst. 19 (12) (2011)
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium (2011)
Aida Todri, Malgorzata Marek-Sadowska
Reliability Analysis and Optimization of Power-Gated ICs. IEEE Trans. Very Large Scale Integr. Syst. 19 (3) (2011)
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen
Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium (2011)
Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
A study of path delay variations in the presence of uncorrelated power and ground supply noise. DDECS (2011)
Aida Todri, Malgorzata Marek-Sadowska
Electromigration study of power-gated grids. ISLPED (2009)
Aida Todri, Malgorzata Marek-Sadowska, Francois Maire, Christophe Matheron
A study of decoupling capacitor effectiveness in power and ground grid networks. ISQED (2009)
Aida Todri, Malgorzata Marek-Sadowska, Joseph N. Kozhaya
Power supply noise aware workload assignment for multi-core systems. ICCAD (2008)
Aida Todri, Malgorzata Marek-Sadowska
A study of reliability issues in clock distribution networks. ICCD (2008)
Aida Todri, Malgorzata Marek-Sadowska, Shih-Chieh Chang
Analysis and optimization of power-gated ICs with multiple power gating configurations. ICCAD (2007)
Aida Todri, Shih-Chieh Chang, Malgorzata Marek-Sadowska
Electromigration and voltage drop aware power grid optimization for power gated ICs. ISLPED (2007)