Ken Mackay

Publication Activity (10 Years)

Years Active: 2012-2020
Publications (10 Years): 3

Top Topics

Quality Metrics

Top Venues

IEEE Trans. Emerg. Top. Comput.

Publications

Arash Nejat, Frederic Ouattara, Mohammad Mohammadinodoushan, Bertrand Cambou, Ken Mackay, Lionel Torres
Practical Experiments to Evaluate Quality Metrics of MRAM-Based Physical Unclonable Functions. IEEE Access 8 (2020)
Frederic Ouattara, Arash Nejat, Lionel Torres, Ken Mackay
Practical Experiments on Fabricated TAS-MRAM Dies to Evaluate the Stochastic Behavior of Voltage-Controlled TRNGs. IEEE Access 7 (2019)
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay
An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay
Automated characterization of TAS-MRAM test arrays. DTIS (2015)
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay
Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. NVMTS (2015)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22 (11) (2014)
Ioan Lucian Prejbeanu, R. C. Sousa, Bernard Dieny, Jean-Pierre Nozieres, S. Bandiera, Jérémy Alvarez-Herault, Q. Stainer, L. Lombard, Clarisse Ducruet, Y. Conraux, Ken Mackay
Scalability and logic functionalities of TA-MRAMs. NEWCAS (2013)
S. Amara-Dababi, R. C. Sousa, H. Béa, C. Baraduc, Ken Mackay, Bernard Dieny
Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise. Microelectron. Reliab. 53 (9-11) (2013)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Coupling-based resistive-open defects in TAS-MRAM architectures. ETS (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE (2012)