Jérémy Alvarez-Herault

Publication Activity (10 Years)

Years Active: 2012-2018
Publications (10 Years): 3

Top Topics

Automatic Analysis

Microscope Images

Top Venues

IEEE Trans. Emerg. Top. Comput.

Publications

Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Christian Wenger, Jérémy Alvarez-Herault, Ken Mackay
An Automated Test Equipment for Characterization of Emerging MRAM and RRAM Arrays. IEEE Trans. Emerg. Top. Comput. 6 (2) (2018)
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Paolo Pellati, Michele Ramponi, Jérémy Alvarez-Herault, Ken Mackay
Automated characterization of TAS-MRAM test arrays. DTIS (2015)
Alessandro Grossi, Cristian Zambelli, Piero Olivo, Jérémy Alvarez-Herault, Ken Mackay
Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions. NVMTS (2015)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22 (11) (2014)
Ioan Lucian Prejbeanu, R. C. Sousa, Bernard Dieny, Jean-Pierre Nozieres, S. Bandiera, Jérémy Alvarez-Herault, Q. Stainer, L. Lombard, Clarisse Ducruet, Y. Conraux, Ken Mackay
Scalability and logic functionalities of TA-MRAMs. NEWCAS (2013)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Coupling-based resistive-open defects in TAS-MRAM architectures. ETS (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium (2012)
Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay
Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE (2012)